SSS-NCL

SuperSharpSilicon™ - Non-Contact / Tapping Mode - Long Cantilever

NANOSENSORS™ SSS-NCL probes are designed for non-contact mode or tapping mode AFM. It is offered as an alternative to the NANOSENSORS™ high frequency non contact type (NCH). The SSS-NCL is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm.
Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The probe offers unique features:

Guaranteed tip radius of curvature < 5 nm

Typical tip radius of curvature of 2 nm

Typical aspect ratio at 200 nm from tip apex in the order of 4:1

Half cone angle at 200 nm from apex < 10°

Monolithic material

Highly doped to dissipate static charge

Chemically inert

High mechanical Q-factor for high sensitivity

Alignment grooves on backside of silicon holder chip

Precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip

Compatible with PointProbe® Plus XY-Alignment Series

Cantilever Specifications
Spring k (N/m	48 (21 - 98)
Freq (kHz)	190 (146 - 196)
Length (µm)	225 (215 - 235)
Mean width (µm)	38 (230 - 45)
Thickness (µm)	7 (6 - 8)
Shape	rectangular
Material	Silicon
Reflex Coating (nm)	None

Tip Specifications
Tip radius (nm)	2
Tip height (µm)	12.5 +/- 2.5
Front angle (°)	25 +/- 2
Back angle (°)	15 +/- 2
Side angle (°)	22.5 +/- 2
Tip shape	4-sided
Tip material	Silicon
Tip coating (nm)	none