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Quick Overview

Silicon probe with sharp tip for high resolution imaging in force modulation mode.

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none
Product Name Price Qty
SSS-FM (50 Pack)
(Ships in 1-2 Weeks)
SSS-FM (20 Pack)
(Ships in 1-2 Weeks)
SSS-FM (10 Pack)
(Ships in 1-2 Weeks)


SuperSharpSilicon™- Force Modulation Mode

NANOSENSORS™ SSS-FM AFM probes are designed for force modulation mode.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.
The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FM tip serves also as a basis for high resolution tips with magnetic coatings (SSS-MFMR). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The probe offers unique features:
• Guaranteed tip radius of curvature < 5 nm
• Typical tip radius of curvature of 2 nm
• Typical aspect ratio at 200 nm from tip apex in the order of 4:1
• Half cone angle at 200 nm from apex < 10°
• Monolithic material
• Highly doped to dissipate static charge
• Chemically inert
• High mechanical Q-factor for high sensitivity

Cantilever Specifications
Spring k (N/m 3 (2 - 4)
Freq (kHz) 75 (45 - 115)
Length (µm) 225 (215 - 235)
Width (µm) 30 (20 - 35)
Thickness (µm) 2.8 (0.5 - 9.5)
Shape rectangular
Material Silicon
Reflex Coating (nm) None

Tip Specifications
Tip radius (nm) 2
Tip height (µm) 12.5 +/- 2.5
Front angle (°) 25 +/- 2
Back angle (°) 15 +/- 2
Side angle (°) 22.5 +/- 2
Tip shape 4-sided
Tip material Silicon
Tip coating (nm) none

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Additional Information

Tip Radius 2
Tip Radius 1-5 nm
Spring Constant 2.8
Frequency 75
Compatibility No
Manufacturer Nanosensors

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