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Items 1 to 50 of 106 total

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  1. PPP-NCLAuD

    Silicon probe with long cantilevr and Au reflective coating for tapping/non contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $320.00

  2. PPP-NCSTR

    Silicon probe with Al reflective coating for soft tapping mode.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: none

    Starting at: $320.00

  3. PPP-XYCONTR

    Silicon probe with XY auto-alignment and Al reflective coating for contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  4. PPP-NCLPt

    Conductive probe with long cantilever for electrical measurements.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

  5. PPP-LM-MFMR

    Silicon probe coated with low moment material for MFM on magnetic samples.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: hard magnetic

    Starting at: $691.00

  6. qp-SCONT

    Quartz like probe with more stability for soft contact mode.
    f = 11 kHz   |   k = 0.01 N/m   |   tip coating: none

    Starting at: $395.00

  7. qp-BioAC-CI

    Quartz like probe with three cantilevers for contact mode.
    f = 30 & 50 & 90 kHz   |   k = 0.06 & 0.1 & 0.3 N/m   |   tip coating: none

    Starting at: $495.00

  8. ATEC-NC

    Silicon probe with visible tip apex.
    f = 335 kHz   |   k = 45 N/m   |   tip coating: none

    Starting at: $445.00

  9. PL2-FM

    Silicon probe with plateau tip for force modulation.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $889.00

  10. PPP-CONT

    Silicon probe without reflective coating for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  11. DT-NCHR

    Silicon probe with diamond coated tip for tapping/non-contact mode on tip degrading samples.
    f = 400 kHz   |   k = 80 N/m   |   tip coating: diamond

    Starting at: $1,185.00

  12. AR10T-NCHR

    Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $2,002.00

  13. SSS-NCH

    Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $734.00

  14. SC-35-M

    CoNi side-coated tip silicon probe for high hi-resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoNi

    Starting at: $860.00

  15. PPP-NCL

    Silicon probe with long cantilever for tapping/non contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $320.00

  16. PPP-NCSTAu

    Conductive probe with Au coating for soft tapping mode electrical measurements.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: Au

    Starting at: $384.00

  17. PPP-CONTSCR

    Silicon probe with short cantilever and Al reflective coating for contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  18. PPP-EFM

    Conductive probe for electrical measurements in force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

  19. PPP-LFMR

    Silicon probe for lateral force microscopy.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  20. TL-NCL

    Tipless long cantilever.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $320.00

  21. FLAT

    Nanosensors Flatness Standard for analysis and correction of the scanner bow, smooth plane with a maximum peak to valley distance of 10nm on a 100x100ยตm2 area.

    Starting at: $800.00

  22. ATEC-FM

    Silicon probe with tip visible at end of lever for force modulation.
    f = 85 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $445.00

  23. PL2-CONT

    Silicon probe with plateau tip for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $889.00

  24. DT-CONTR

    Silicon probe with Al reflex coating and diamond coated tip for contact mode on tip degrading samples.
    f = 20 kHz   |   k = 0.5 N/m   |   tip coating: diamond

    Starting at: $1,185.00

  25. AR10-NCHR

    Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $1,334.00

  26. SSS-FM

    Silicon probe with sharp tip for high resolution imaging in force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $757.00

  27. SC-20-M

    CoNi side-coated tip silicon probe for high hi-resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoNi

    Starting at: $1,025.00

  28. PPP-NCHAuD

    Silicon probe with Au reflex coating for tapping/non contact mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $320.00

  29. PPP-FMR

    Silicon probe with Al reflective coating for force modulation.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $320.00

  30. PPP-CONTSCAu

    Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: $384.00

  31. PPP-CONTPt

    Conductive probe for electrical measurements in contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

  32. AR5T-NCH

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $1,334.00

  33. TL-FM

    Tipless cantilever.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $320.00

  34. 2D200

    Nanosensors Calibration Standard for the x-y calibration of the scanning mechanism, lattice of inverted pyramids, 200nm pitch.
    5mm x 7mm Si die  , 200 nm pitch

    Starting at: $1,300.00

  35. PPP-RT-NCHR

    Silicon probe with rotated tip and Al reflective coating for tapping/non contact mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $320.00

  36. ATEC-CONT

    Silicon probe with visible tip apex for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $445.00

  37. CDT-NCHR

    Silicon probe with conductive diamond coated tip for electrical measurements.
    f = 400 kHz   |   k = 80 N/m   |   tip coating: conductive diamond

    Starting at: $1,481.00

  38. PtSi-NCH

    Sharp conductive probe with PtSi coating for electrical measurements.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: PtSi

    Starting at: $1,481.00

  39. SSS-MFMR

    Silicon probe coated with thin magnetic material for high resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: hard magnetic

    Starting at: $1,185.00

  40. SC-10-M

    CoNi side-coated tip silicon probe for high resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoNi

    Starting at: $1,190.00

  41. PPP-NCH

    Silicon probe with no reflex coating for tapping/non contact mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $320.00

  42. PPP-FMAu

    Conductive silicon probe with Au coating for electrical measurements.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Au

    Starting at: $384.00

  43. PPP-CONTR

    Silicon probe with Al reflective coating for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  44. ATEC-EFM

    Conductive probe with visible tip apex for electrical measurements in modulation mode.
    f = 85 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: $890.00

  45. AR5-NCL

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $889.00

  46. SSS-NCLR

    Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $757.00

  47. PPP-RT-FMR

    Silicon probe with rotated tip for force modulation.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $320.00

  48. PPP-NCLR

    Silicon probe with long cantilever and Al reflective coating for tapping/non contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $320.00

  49. PPP-QFMR

    High Q silicon probe with Al reflective coating for force modulation in vacuum.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $640.00

  50. CDT-CONTR

    Silicon probe with conductive diamond coated tip for electrical measurements.
    f = 20 kHz   |   k = 0.5 N/m   |   tip coating: conductive diamond

    Starting at: $1,481.00

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Items 1 to 50 of 106 total

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