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Quick Overview

Silicon probe with PtSi coating for contact mode

f = 13 kHz   |   k = 0.2 N/m   |   tip coating: PtSi
Product Name Price Qty
PtSi-CONT (50 Pack)
(Ships in 1-2 Weeks)
PtSi-CONT (20 Pack)
(Ships in 1-2 Weeks)
PtSi-CONT (10 Pack)
(Ships in 1-2 Weeks)


Platinum Silicide Probes Contact Mode

NANOSENSORS™ PtSi-CONT probes are designed for contact mode (repulsive mode) AFM imaging. Furthermore this probe can be used for force-distance spectroscopy or pulsed force mode (PFM) The CONT type is optimized for high sensitivity due a low force constant. For applications that require a wear resistant and electrically conductive tip we recommend this type. NANOSENSORS PtSi-CONT are suitable for C-AFM, Tunneling AFM (TUNA) and Scanning Capacitance Microscopy (SCM).
The Platinum Silicide coating shows an excellent conductivity (almost approaching metal conductivity). The typical tip radius of curvature is around 25 nm.

The probe offers unique features:
  • Platinum silicide coating with excellent conductivity and good wear-out behavior
  • High mechanical Q-factor for high sensitivity
  • Alignment grooves on backside of silicon holder chip

    Cantilever Specifications
    Spring k (N/m 0.2 (0.02 - 0.77)
    Freq (kHz) 13 (6 - 21)
    Length (µm) 450 (440 - 460)
    Width (µm) 50 (42.5 - 57.5)
    Thickness (µm) 2.0 (1.0 - 3.0)
    Shape rectangular
    Material Silicon
    Reflex Coating (nm) PtSi

    Tip Specifications
    Tip radius (nm) 25 +/- 5
    Tip height (µm) 12.5 +/- 2.5
    Front angle (°) 25 +/- 2
    Back angle (°) 15 +/- 2
    Side angle (°) 22.5 +/- 2
    Tip shape 4-sided
    Tip material Silicon
    Tip coating (nm) PtSi

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    Additional Information

    Tip Radius 25
    Tip Radius > 20 nm
    Spring Constant 0.2
    Frequency 13
    Compatibility blueDrive
    Manufacturer Nanosensors

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