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Probes
Silicon probe with sharp tip for high resolution imaging in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with visible tip apex and Al reflex coating for high speed imaging.
f = 1500 kHz | tip coating: none
Silicon probe with visible tip apex and Au reflex coating for high speed imaging.
f = 1500 kHz | tip coating: none
Silicon probe with sharp tip for high resolution imaging in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
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