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Probes

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8 Item(s)

  1. SSS-FM

    SSS-FM

    Silicon probe with sharp tip for high resolution imaging in force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $757.00

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  2. FS-1500

    FS-1500

    Silicon probe with visible tip apex and Al reflex coating for high speed imaging.
    f = 1500 kHz   |   tip coating: none

    Starting at: $590.00

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  3. FS-1500AuD

    FS-1500AuD

    Silicon probe with visible tip apex and Au reflex coating for high speed imaging.
    f = 1500 kHz   |   tip coating: none

    Starting at: $590.00

     Add to Cart
  4. SSS-FMR

    SSS-FMR

    Silicon probe with sharp tip for high resolution imaging in force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $757.00

     Add to Cart
  5. SSS-NCH

    SSS-NCH

    Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $757.00

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  6. SSS-NCHR

    SSS-NCHR

    Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $757.00

     Add to Cart
  7. SSS-NCLR

    SSS-NCLR

    Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $757.00

     Add to Cart
  8. SSS-NCL

    SSS-NCL

    Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $757.00

     Add to Cart
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8 Item(s)

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  1. Remove This Item Manufacturer: Asylum Research
  2. Remove This Item Manufacturer: Nanosensors
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  4. Remove This Item Topography: Fast Scanning
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Prices
Price
  1. $500 - $1000 (8)
Applications
Force Spectroscopy
  1. Modulus Range: MPa (2)
  2. Pulling Force Range: pN (2)
Nanomechanics
  1. Bimodal/Multi-Frequency (2)
  2. Stiffness Imaging (2)
  3. Viscoelastic Mapping (2)
Polymer
  1. Thermal Transition (2)
  2. Mechanics (2)
  3. Topography (3)
Semiconductors
  1. Defect Review (6)
  2. Deep Trench (6)
Topography
  1. Tapping (15)
  2. Soft Tapping (4)
  3. Force Modulation (7)
  4. Contact (10)
  5. Fast Scanning (2)
  6. High Resolution (6)
  7. High Aspect Ratio (8)
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Probe Specs
Spring Constant
  1. 1-10 (N/m) (4)
  2. 10-100 (N/m) (4)
Tip Radius
  1. 1-5 nm (6)
  2. 5-10 nm (2)
Frequency
  1. 10kHz - 100kHz (2)
  2. 100kHz - 2.5MHz (6)
Tip Coating
  1. None (8)
Reflex Coating
  1. None (3)
  2. AI (5)
Misc
Compatibility
  1. GetReal \ GetStarted (2)
  2. blueDrive (3)
Imaging Environment
  1. Air (8)
Manufacturer
  1. Asylum Research (2)
  2. Olympus (4)
  3. Nanosensors (6)
  4. Nanoworld (10)
  5. Nanotools (2)
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Sample Type
  1. Soft (cells, hydrogels) (2)
  2. Medium (polymers, rubbers) (4)
  3. Hard (metals, semiconductors) (4)
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Contact Information
  •  

    Address:
    6310 Hollister Ave
    Santa Barbara, California 93117

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    Phone: (805) 696-6466
    Fax: 805-512-9805

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    Email:
    ProbeStore@AsylumResearch.com

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    Working Days/Hours:
    Mon - Fri / 8:00AM - 5:00PM PST

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