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Probes

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13 Item(s)

  1. PPP-CONTSCR

    Silicon probe with short cantilever and Al reflective coating for contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  2. PPP-CONT

    Silicon probe without reflective coating for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  3. PPP-CONTAuD

    Silicon probe with Au reflective coating for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  4. ATEC-CONT

    Silicon probe with visible tip apex for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $445.00

  5. PPP-CONTR

    Silicon probe with Al reflective coating for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  6. PPP-RT-CONTR

    Silicon probe with rotated tip and Al reflective coating for contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  7. BL-TR400PB

    Nitride probe with two triangular cantilevers for iDrive mode.
    f = 10 & 32 kHz   |   k =0.02 & 0.09 N/m   |   tip coating: Cr/Au

    Starting at: $450.00

  8. PPP-CONTSC

    Silicon probe with short cantilever without reflective coating for contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  9. DT-CONTR

    Silicon probe with Al reflex coating and diamond coated tip for contact mode on tip degrading samples.
    f = 20 kHz   |   k = 0.5 N/m   |   tip coating: diamond

    Starting at: $1,185.00

  10. PPP-LFMR

    Silicon probe for lateral force microscopy.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  11. AD-0.5-AS

    Contact mode with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
    f = 30 kHz   |   k = 0.5 N/m   |   tip coating: diamond tip

    Starting at: $2,000.00

  12. NM-RC-C

    Specially designed probes for high mechanical loads and scratch testing applications. Each probe comes with a calibrated spring constant and high resolution SEM showing the tip radius and cone angle.
    f = 750 kHz   |   k = 350 N/m   |   tip coating: diamond tip

    Starting at: $2,500.00

    Ships in 4 Weeks

  13. NM-TC

    Specially designed probes for high mechanical loads and scratch testing applications. For a similar probe but with a higher resolution tip, see NM-RC
    f = 750 kHz   |   k = 350 N/m   |   tip coating: diamond tip

    Starting at: $750.00

    Ships in 4 Weeks

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13 Item(s)