SSS-FMR

SuperSharpSilicon™- Force Modulation Mode - Reflex Coating

NANOSENSORS™ SSS-FMR AFM probes are designed for force modulation mode.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.
The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FMR tip serves also as a basis for high resolution tips with magnetic coating (SSS-MFMR). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The probe offers unique features:

Guaranteed tip radius of curvature < 5 nm

Typical tip radius of curvature of 2 nm

Typical aspect ratio at 200 nm from tip apex in the order of 4:1

Half cone angle at 200 nm from apex < 10°

Monolithic material

Highly doped to dissipate static charge

Chemically inert

High mechanical Q-factor for high sensitivity

Cantilever Specifications
Spring k (N/m	3 (2 - 4)
Freq (kHz)	75 (45 - 115)
Length (µm)	225 (215 - 235)
Width (µm)	30 (20 - 35)
Thickness (µm)	2.8 (0.5 - 9.5)
Shape	rectangular
Material	Silicon
Reflex Coating (nm)	Al

Tip Specifications
Tip radius (nm)	2
Tip height (µm)	12.5 +/- 2.5
Front angle (°)	25 +/- 2
Back angle (°)	15 +/- 2
Side angle (°)	22.5 +/- 2
Tip shape	4-sided
Tip material	Silicon
Tip coating (nm)	none