Details
SuperSharpSilicon™- Force Modulation Mode - Reflex Coating
NANOSENSORS™ SSS-FMR AFM probes are designed for force modulation mode.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.
The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FMR tip serves also as a basis for high resolution tips with magnetic coating (SSS-MFMR). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.
The probe offers unique features:
Guaranteed tip radius of curvature < 5 nm
Typical tip radius of curvature of 2 nm
Typical aspect ratio at 200 nm from tip apex in the order of 4:1
Half cone angle at 200 nm from apex < 10°
Monolithic material
Highly doped to dissipate static charge
Chemically inert
High mechanical Q-factor for high sensitivity
Cantilever Specifications
|
Spring k (N/m |
3 (2 - 4)
|
Freq (kHz) |
75 (45 - 115)
|
Length (µm) |
225 (215 - 235)
|
Width (µm) |
30 (20 - 35)
|
Thickness (µm) |
2.8 (0.5 - 9.5)
|
Shape |
rectangular
|
Material |
Silicon
|
Reflex Coating (nm) |
Al
|
Tip Specifications
|
Tip radius (nm) |
2
|
Tip height (µm) |
12.5 +/- 2.5
|
Front angle (°) |
25 +/- 2
|
Back angle (°) |
15 +/- 2
|
Side angle (°) |
22.5 +/- 2
|
Tip shape |
4-sided
|
Tip material |
Silicon
|
Tip coating (nm) |
none
|
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