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Probes

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6 Item(s)

  1. NW-SSS-NCH

    Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $699.00

  2. USC-F1.2-k0.15

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 1200 kHz   |   k = 0.15 N/m   |   tip coating: none

    Starting at: $980.00

    Ships in 1-2 Weeks

  3. USC-F2-k3

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 2000 kHz   |   k = 3 N/m   |   tip coating: none

    Starting at: $980.00

  4. USC-F0.3-k0.3

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 300 kHz   |   k = 0.3 N/m   |   tip coating: none

    Starting at: $980.00

  5. USC-F1.2-k7.3

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 1200 kHz   |   k = 7.3 N/m   |   tip coating: none

    Starting at: $980.00

  6. NW-SSS-NCL

    Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $699.00

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6 Item(s)