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Probes
BioLever fast with CNF tips (also known as BL-AC10FS); Carbon Nano Fiber probe for high resolution imaging.
Only on AFMs with
small laser spot such as Cypher.
f = 1500 kHz | k = 0.1 N/m | tip coating: none
Silicon probe with sharp tip for high resolution imaging in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
To be used only on AFMs with
small laser spot
f = 300 kHz | k = 0.3 N/m | tip coating: none
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: none
Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
To be used only on AFMs with
small laser spot
f = 1200 kHz | k = 7.3 N/m | tip coating: none
Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: none
Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
To be used only on AFMs with
small laser spot
f = 1200 kHz | k = 0.15 N/m | tip coating: none
Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
To be used only on AFMs with
small laser spot
f = 2000 kHz | k = 3 N/m | tip coating: none
Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
f = 320 kHz | k = 42 N/m | tip coating: none
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 190 kHz | k = 48 N/m | tip coating: none
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