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Probes

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Items 1 to 50 of 77 total

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  1. PPP-XYCONTR

    Silicon probe with XY auto-alignment and Al reflective coating for contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  2. TL-FM

    Tipless cantilever.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $320.00

  3. ASY.STM.PKG

    Platinum/Iridium (80/20) mechanically formed tip for STM application.
    Dia = 0.01"   |   lngth = 0.28"   |   tip material: Pt

    Starting at: $300.00

  4. HA100WS

    silicon nitride sharpened wedge tip for tapping mode in liquid.
    f = 160 kHz   |   k = 15 N/m   |   tip coating: none

    Starting at: $1,750.00

    Ships in 1-2 Weeks

  5. PPP-CONTAu

    Conductive silicon probe with Au tip coating for contact mode electrical measurements.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: $384.00

  6. PPP-CONTSCPt

    Conductive probe with short cantilever for electrical measurements in contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

  7. PL2-CONTR

    Silicon probe with Al reflective coating and plateau tip for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $889.00

  8. PPP-LFMR

    Silicon probe for lateral force microscopy.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  9. CONTPt

    Test Conductive probe with visible tip apex for electrical measurements in contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: $419.00

    Ships in 1-2 Weeks

  10. ATEC-CONTPt

    Conductive probe with visible tip apex for electrical measurements in contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: $890.00

  11. Arrow CONTPt

    Silicon probe with tip at the end of cantilever and PtIr coating for contact mode.
    f = 14 kHz   |   k =0.2 N/m   |   tip coating: PtIr

    Starting at: $407.00

  12. PPP-CONTSCAu

    Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: $384.00

  13. PtSi-CONT

    Silicon probe with PtSi coating for contact mode
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: PtSi

    Starting at: $1,481.00

  14. PPP-CONTPt

    Conductive probe for electrical measurements in contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

  15. PL2-CONT

    Silicon probe with plateau tip for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $889.00

  16. Arrow EFM

    Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: $407.00

  17. DT-CONTR

    Silicon probe with Al reflex coating and diamond coated tip for contact mode on tip degrading samples.
    f = 20 kHz   |   k = 0.5 N/m   |   tip coating: diamond

    Starting at: $1,185.00

  18. Arrow CONT

    Silicon probe with tip at the end of cantilever and no reflex coating for contact mode.
    f = 14 kHz   |   k =0.2 N/m   |   tip coating: none

    Starting at: $270.00

  19. PPP-CONTSC

    Silicon probe with short cantilever without reflective coating for contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  20. USC-F1.5-k0.6

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 1500 kHz   |   k = 0.6 N/m   |   tip coating: none

    Starting at: $980.00

  21. PNP-DB

    Pyrex probe with two diving board nitride cantilevers and tip for life science applications.
    f = 17 & 67 kHz   |   k = 0.06 & 0.48 N/m   |   tip coating: none

    Starting at: $440.00

  22. ATEC-CONTAu

    Conductive silicon probe with visible tip apex for contact mode electrical measurements.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: $890.00

  23. CDT-CONTR

    Silicon probe with conductive diamond coated tip for electrical measurements.
    f = 20 kHz   |   k = 0.5 N/m   |   tip coating: conductive diamond

    Starting at: $1,481.00

  24. Arrow CONTR

    Silicon probe with tip at the end of cantilever and AL reflex coating for contact mode.
    f = 14 kHz   |   k =0.2 N/m   |   tip coating: none

    Starting at: $297.00

  25. PNP-TR-Au

    Pyrex probe with two triangular gold coated nitride cantilevers and tip for life science applications.
    f = 17 & 67 kHz   |   k = 0.08 & 0.32 N/m   |   tip coating: AU(35)

    Starting at: $480.00

  26. PPP-FMAu

    Conductive silicon probe with Au coating for electrical measurements.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Au

    Starting at: $384.00

  27. PNP-TR

    Pyrex probe with two triangular nitride cantilevers and tip for life science applications.
    f = 17 & 67 kHz   |   k = 0.08 & 0.32 N/m   |   tip coating: none

    Starting at: $440.00

  28. PNP-TRS

    Pyrex probe with single nitride cantilever and tip for bio applications
    f = 67 kHz   |   k =0.32 N/m   |   tip coating: none

    Starting at: $440.00

    Ships in 1-2 Weeks

  29. ATEC-CONT

    Silicon probe with visible tip apex for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $445.00

  30. 12PT300B

    Solid platinum probe for electrical measurements.
    f = 9 kHz   |   k = 0.8 N/m   |   tip material: Pt

    Starting at: $400.00

  31. USC-F5-k30

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 5000 kHz   |   k = 30 N/m   |   tip coating: none

    Starting at: $980.00

  32. CONTSCR

    Silicon probe with short cantilever for contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $307.00

  33. USC-F1.2-k0.15

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 1200 kHz   |   k = 0.15 N/m   |   tip coating: none

    Starting at: $980.00

    Ships in 1-2 Weeks

  34. SC-35-M

    CoNi side-coated tip silicon probe for high hi-resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoNi

    Starting at: $860.00

  35. CONTR

    Silicon probe with Al reflex coating for contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $307.00

  36. PPP-CONTAuD

    Silicon probe with Au reflective coating for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  37. USC-F2-k3

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 2000 kHz   |   k = 3 N/m   |   tip coating: none

    Starting at: $980.00

  38. SC-20-LM

    Ni side-coated tip silicon probe for high resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Ni

    Starting at: $1,135.00

    Ships in 3 Weeks

  39. 12PT400B

    Solid platinum probe for electrical measurements.
    f = 4.5 kHz   |   k = 0.3 N/m   |   tip material: Pt

    Starting at: $400.00

  40. CONTSC

    Silicon probe with short cantilever and no reflex coating for contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $279.00

  41. PPP-RT-CONTR

    Silicon probe with rotated tip and Al reflective coating for contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  42. PPP-CONTR

    Silicon probe with Al reflective coating for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  43. USC-F1.2-k7.3

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 1200 kHz   |   k = 7.3 N/m   |   tip coating: none

    Starting at: $980.00

  44. USC-F0.3-k0.3

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 300 kHz   |   k = 0.3 N/m   |   tip coating: none

    Starting at: $980.00

  45. SC-35-LM

    Ni side-coated tip silicon probe for high hi-resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Ni

    Starting at: $970.00

  46. CONT

    Silicon probe with no reflex coating for contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $279.00

  47. PPP-CONTSCAuD

    Silicon probe with short cantilever and Au reflective coating for contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  48. SC-20-M

    CoNi side-coated tip silicon probe for high hi-resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoNi

    Starting at: $1,025.00

  49. qp-CONT

    Quartz like probe with more stability for contact mode.
    f = 30 kHz   |   k = 0.1 N/m   |   tip coating: none

    Starting at: $395.00

  50. SC-10-M

    CoNi side-coated tip silicon probe for high resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoNi

    Starting at: $1,190.00

Set Descending Direction

   

Items 1 to 50 of 77 total

  1. 1
  2. 2