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Probes

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29 Item(s)

  1. Arrow UHF

    Silicon probe with visible tip apex and Al reflex coating for high speed imaging.
    f = 2000 kHz   |   tip coating: none

    Starting at: $600.00

  2. Arrow UHFAuD

    Silicon probe with visible tip apex and Au reflex coating for high speed imaging.
    f = 2000 kHz   |   tip coating: none

    Starting at: $600.00

  3. SC-10-M

    CoNi side-coated tip silicon probe for high resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoNi

    Starting at: $1,190.00

  4. EFM

    Silicon probe with PtIr coating for force modulation.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: $419.00

  5. CONTSC

    Silicon probe with short cantilever and no reflex coating for contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $279.00

  6. SC-20-M

    CoNi side-coated tip silicon probe for high hi-resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoNi

    Starting at: $1,025.00

  7. USC-F1.2-k0.15

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 1200 kHz   |   k = 0.15 N/m   |   tip coating: none

    Starting at: $980.00

    Ships in 1-2 Weeks

  8. USC-F0.3-k0.3

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 300 kHz   |   k = 0.3 N/m   |   tip coating: none

    Starting at: $980.00

  9. CONT

    Silicon probe with no reflex coating for contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $279.00

  10. USC-F5-k30

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 5000 kHz   |   k = 30 N/m   |   tip coating: none

    Starting at: $980.00

  11. CONTSCR

    Silicon probe with short cantilever for contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $307.00

  12. SC-35-LM

    Ni side-coated tip silicon probe for high hi-resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Ni

    Starting at: $970.00

  13. 12PT400B

    Solid platinum probe for electrical measurements.
    f = 4.5 kHz   |   k = 0.3 N/m   |   tip material: Pt

    Starting at: $400.00

  14. CONTR

    Silicon probe with Al reflex coating for contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $307.00

  15. SC-20-LM

    Ni side-coated tip silicon probe for high resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Ni

    Starting at: $1,135.00

    Ships in 3 Weeks

  16. USC-F2-k3

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 2000 kHz   |   k = 3 N/m   |   tip coating: none

    Starting at: $980.00

  17. SC-35-M

    CoNi side-coated tip silicon probe for high hi-resolution MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoNi

    Starting at: $860.00

  18. 12PT300B

    Solid platinum probe for electrical measurements.
    f = 9 kHz   |   k = 0.8 N/m   |   tip material: Pt

    Starting at: $400.00

  19. USC-F1.2-k7.3

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 1200 kHz   |   k = 7.3 N/m   |   tip coating: none

    Starting at: $980.00

  20. PNP-TR

    Pyrex probe with two triangular nitride cantilevers and tip for life science applications.
    f = 17 & 67 kHz   |   k = 0.08 & 0.32 N/m   |   tip coating: none

    Starting at: $440.00

  21. USC-F1.5-k0.6

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 1500 kHz   |   k = 0.6 N/m   |   tip coating: none

    Starting at: $980.00

  22. Arrow CONT

    Silicon probe with tip at the end of cantilever and no reflex coating for contact mode.
    f = 14 kHz   |   k =0.2 N/m   |   tip coating: none

    Starting at: $245.00

  23. PNP-TR-Au

    Pyrex probe with two triangular gold coated nitride cantilevers and tip for life science applications.
    f = 17 & 67 kHz   |   k = 0.08 & 0.32 N/m   |   tip coating: AU(35)

    Starting at: $480.00

  24. PNP-DB

    Pyrex probe with two diving board nitride cantilevers and tip for life science applications.
    f = 17 & 67 kHz   |   k = 0.06 & 0.48 N/m   |   tip coating: none

    Starting at: $440.00

  25. PNP-TRS

    Pyrex probe with single nitride cantilever and tip for bio applications
    f = 67 kHz   |   k =0.32 N/m   |   tip coating: none

    Starting at: $440.00

    Ships in 1-2 Weeks

  26. Arrow CONTR

    Silicon probe with tip at the end of cantilever and AL reflex coating for contact mode.
    f = 14 kHz   |   k =0.2 N/m   |   tip coating: none

    Starting at: $270.00

  27. Arrow EFM

    Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: $370.00

  28. CONTPt

    Test Conductive probe with visible tip apex for electrical measurements in contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: $419.00

    Ships in 1-2 Weeks

  29. Arrow CONTPt

    Silicon probe with tip at the end of cantilever and PtIr coating for contact mode.
    f = 14 kHz   |   k =0.2 N/m   |   tip coating: PtIr

    Starting at: $370.00

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29 Item(s)