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Probes

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Items 1 to 50 of 91 total

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  1. PPP-QLC-MFMR

    Silicon probe coated with low coercivity material for MFM in vacuum.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: soft magnetic

    Starting at: $1,185.00

  2. SSS-QMFMR

    Silicon probe coated with thin magnetic material for high resolution MFM in vacuum.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: hard magnetic

    Starting at: $1,334.00

  3. PL2-NCHR

    Silicon probe with plateau tip with Al reflex coating.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $889.00

  4. PL2-NCLR

    Silicon probe with plateau tip with Al reflex coating.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $889.00

    Ships in 1-2 Weeks

  5. ATEC-NCAu

    Conductive silicon probe with Au tip coating and visible tip apex.
    f = 335 kHz   |   k = 45 N/m   |   tip coating: Au

    Starting at: $890.00

  6. ATEC-NCPt

    Conductive probe with visible tip apex for electrical measurements.
    f = 335 kHz   |   k = 45 N/m   |   tip coating: Pt/Ir

    Starting at: $890.00

  7. PtSi-CONT

    Silicon probe with PtSi coating for contact mode
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: PtSi

    Starting at: $1,481.00

  8. NW-S-MFMR

    Silicon probe coated with low moment material for MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: soft magnetic

    Starting at: $615.00

  9. ATEC-CONTPt

    Conductive probe with visible tip apex for electrical measurements in contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: $890.00

  10. CONTPt

    Test Conductive probe with visible tip apex for electrical measurements in contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: $419.00

    Ships in 1-2 Weeks

  11. PPP-CONTSCAu

    Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: $384.00

  12. Arrow CONTPt

    Silicon probe with tip at the end of cantilever and PtIr coating for contact mode.
    f = 14 kHz   |   k =0.2 N/m   |   tip coating: PtIr

    Starting at: $407.00

  13. PPP-NCSTPt

    Conductive probe for electrical measurements in soft tapping mode.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

  14. PPP-CONTPt

    Conductive probe for electrical measurements in contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

  15. PPP-CONTAu

    Conductive silicon probe with Au tip coating for contact mode electrical measurements.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: $384.00

  16. PPP-NCHPt

    Conductive probe for electrical measurements.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

  17. PPP-LFMR

    Silicon probe for lateral force microscopy.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  18. Arrow EFM

    Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: $407.00

  19. PPP-CONTSCPt

    Conductive probe with short cantilever for electrical measurements in contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

  20. SSS-NCLR

    Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $757.00

  21. CDT-NCLR

    Silicon probe with conductive diamond coated tip and long cantilever for electrical measurements.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: conductive diamond

    Starting at: $1,481.00

  22. ATEC-FMAu

    Conductive probe with tip visible at end of lever.
    f = 85 kHz   |   k = 2.8 N/m   |   tip coating: Au

    Starting at: $890.00

  23. PPP-NCLPt

    Conductive probe with long cantilever for electrical measurements.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

  24. NW-AR5-NCLR

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $839.00

  25. Arrow NCR

    Silicon probe with tip at the end of cantilever and Al reflex coating for tapping/non-contact mode.
    f = 285 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $297.00

  26. PPP-FMAu

    Conductive silicon probe with Au coating for electrical measurements.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Au

    Starting at: $384.00

  27. PNP-DB

    Pyrex probe with two diving board nitride cantilevers and tip for life science applications.
    f = 17 & 67 kHz   |   k = 0.06 & 0.48 N/m   |   tip coating: none

    Starting at: $440.00

  28. NCLPt

    Silicon probe with long cantilever and PtIr coating for tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: PtIr

    Starting at: $419.00

  29. PNP-TR-Au

    Pyrex probe with two triangular gold coated nitride cantilevers and tip for life science applications.
    f = 17 & 67 kHz   |   k = 0.08 & 0.32 N/m   |   tip coating: AU(35)

    Starting at: $480.00

  30. NW-CDT-NCLR

    Nanoworld silicon probe with long cantilever and conductive diamond coating for tapping/non-contact mode.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: conductive diamond

    Starting at: $1,399.00

  31. PNP-TRS

    Pyrex probe with single nitride cantilever and tip for bio applications
    f = 67 kHz   |   k =0.32 N/m   |   tip coating: none

    Starting at: $440.00

    Ships in 1-2 Weeks

  32. NW-AR10-NCHR

    Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $1,259.00

  33. PNP-TR

    Pyrex probe with two triangular nitride cantilevers and tip for life science applications.
    f = 17 & 67 kHz   |   k = 0.08 & 0.32 N/m   |   tip coating: none

    Starting at: $440.00

  34. USC-F1.5-k0.6

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 1500 kHz   |   k = 0.6 N/m   |   tip coating: none

    Starting at: $980.00

  35. AR5-NCLR

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $889.00

  36. CDT-CONTR

    Silicon probe with conductive diamond coated tip for electrical measurements.
    f = 20 kHz   |   k = 0.5 N/m   |   tip coating: conductive diamond

    Starting at: $1,481.00

  37. Arrow NCPt

    Silicon probe with PtIr coating for contact mode.
    f = 285 kHz   |   k = 42 N/m   |   tip coating: Pt/Ir

    Starting at: $407.00

  38. PtSi-NCH

    Sharp conductive probe with PtSi coating for electrical measurements.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: PtSi

    Starting at: $1,481.00

  39. PPP-NCLAu

    Conductive silicon probe with long cantilever for conductive measurements.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: Au

    Starting at: $384.00

  40. Arrow CONTR

    Silicon probe with tip at the end of cantilever and AL reflex coating for contact mode.
    f = 14 kHz   |   k =0.2 N/m   |   tip coating: none

    Starting at: $297.00

  41. AR5T-NCHR

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $1,334.00

  42. USC-F1.2-k0.15

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 1200 kHz   |   k = 0.15 N/m   |   tip coating: none

    Starting at: $980.00

    Ships in 1-2 Weeks

  43. USC-F0.3-k0.3

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 300 kHz   |   k = 0.3 N/m   |   tip coating: none

    Starting at: $980.00

  44. PPP-NCHAu

    Conductive silicon probe with Au tip coating for electrical measurements in non-contact/tapping mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: Au

    Starting at: $384.00

  45. USC-F1.2-k7.3

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 1200 kHz   |   k = 7.3 N/m   |   tip coating: none

    Starting at: $980.00

  46. SSS-NCHR

    Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $757.00

  47. CDT-NCHR

    Silicon probe with conductive diamond coated tip for electrical measurements.
    f = 400 kHz   |   k = 80 N/m   |   tip coating: conductive diamond

    Starting at: $1,481.00

  48. PPP-LM-MFMR

    Silicon probe coated with low moment material for MFM on magnetic samples.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: hard magnetic

    Starting at: $691.00

  49. AR10-NCHR

    Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $1,334.00

  50. PPP-NCLAuD

    Silicon probe with long cantilevr and Au reflective coating for tapping/non contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $320.00

Set Descending Direction

   

Items 1 to 50 of 91 total

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