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Probes
Also known as OTESPA; silicon probe with visible apex tip for tapping mode.
f = 300 kHz | k = 26 N/m | tip coating: none
Also known as OLTESPA; medium soft cantilever for topgraphy and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
Silicon probe with visible apex tip for force modulation or soft tapping on medium to hard samples.
f = 150 kHz | k =9 N/m | tip coating: none
Asylum electrolever with visible tip apex and conductive coating for nano-electrical measurements
f = 75 kHz | k = 2.8 N/m | tip coating: Ti/Ir
Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
f = 285 kHz | k = 42 N/m | tip coating: Ti/Ir
OLTESPA with Au reflective coating; medium soft cantilever for topography and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
Silicon probe with visible tip apex and Al reflex coating for high speed imaging.
f = 2000 kHz | tip coating: none
Silicon probe with visible tip apex and magnetic coating for high moment MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoCr
Fast silicon probe with visible apex tip for fast imaging.
Only on AFMs with
small laser spot such as Cypher.
f = 1600 kHz | k = 85 N/m | tip coating: none
Silicon probe with visible tip apex and magnetic coating for high coercivity MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoPt/FePt
Silicon probe with visible tip apex and Al reflex coating for high speed imaging.
f = 1500 kHz | tip coating: none
Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
f = 300 kHz | k = 42 N/m | tip coating: Ti/Ir
Silicon probe with visible tip apex and magnetic coating for low coercivity MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: permalloy
Silicon probe with sharp tip for high resolution imaging in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with visible tip apex and Au reflex coating for high speed imaging.
f = 2000 kHz | tip coating: none
Silicon probe with visible tip apex and magnetic coating for standard MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoCr
OTESPA with Au reflective coating; silicon probe with visible apex tip for tapping mode.
f = 300 kHz | k = 26 N/m | tip coating: none
Silicon probe with visible tip apex and Au reflex coating for high speed imaging.
f = 1500 kHz | tip coating: none
Sharp conductive probe with PtSi coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: PtSi
Silicon probe with visible tip apex and magnetic coating for low moment MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoCr
Also known as OSCM; conductive probe with visible apex tip for electrical measurement.
f = 70 kHz | k = 2 N/m | tip coating: Ti/Pt
Silicon probe with sharp tip for high resolution imaging in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Force modulation with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 65 kHz | k = 2.8 N/m | tip coating: diamond tip
Silicon probe coated with high moment material for MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magnetic
Silicon probe with no reflective coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with PtIr coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/Ir
Nitride probe with shielded co-axial sensor specialized for sMIM applications.
f = 75 kHz | k = 8 N/m | tip coating: TiW/Au
Silicon probe with no reflex coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with high aspect ratio (>10) tip for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with no reflex coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
CoNi side-coated tip silicon probe for high resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: CoNi
Nitride probe with shielded co-axial sensor specialized for sMIM applications.
f = 19 kHz | k = 1 N/m | tip coating: TiW/Au
Silicon probe with no reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with Al reflex coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with Al reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Fast scanning probe with full carbon tip; for ultrafast high resolution bioimaging.
f = 1200 kHz | k = 18 N/m | tip coating: none
Silicon probe with Al reflex coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with no reflex coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Five each of Asylum MFM levers (ASYMFM; ASYMFMHC-R2; ASYMFMHM; ASYMFMLC; ASYMFMLM); Veeco equiv - MESPSP
Silicon probe with Al reflective coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Force modulation probe with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 65 kHz | k = 2.8 N/m | tip coating: diamond tip
Silicon probe with conductive diamond coating for force modulation mode.
f = 105 kHz | k = 6.2 N/m | tip coating: conductive diamond
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: Pt
Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
To be used only on AFMs with
small laser spot
f = 1200 kHz | k = 0.15 N/m | tip coating: none
CoNi side-coated tip silicon probe for high hi-resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: CoNi
Conductive silicon probe with Au tip coating for electrical measurements in non-contact/tapping mode.
f = 330 kHz | k = 42 N/m | tip coating: Au
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with conductive diamond coating for force modulation mode.
f = 105 kHz | k = 6.2 N/m | tip coating: conductive diamond
Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
To be used only on AFMs with
small laser spot
f = 5000 kHz | k = 30 N/m | tip coating: none
Silicon probe coated with low coercivity material for MFM on soft magnetic samples.
f = 75 kHz | k = 2.8 N/m | tip coating: soft magnetic
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