Americas
North America
South America
Canada
Australia
Probes
AC160TS-R3
Also known as OTESPA; silicon probe with visible apex tip for tapping mode.
f = 300 kHz | k = 26 N/m | tip coating: noneStarting at: $360.00
AC160TSA-R3
OTESPA with Au reflective coating; silicon probe with visible apex tip for tapping mode.
f = 300 kHz | k = 26 N/m | tip coating: noneStarting at: $410.00
PtSi-FM
Sharp conductive probe with PtSi coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: PtSiStarting at: $1,481.00
AC55TS
Fast silicon probe with visible apex tip for fast imaging.
Only on AFMs with small laser spot such as Cypher.
f = 1600 kHz | k = 85 N/m | tip coating: noneStarting at: $325.00
PPP-NCHR
Silicon probe with Al reflective coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $320.00
PPP-MFMR
Silicon probe coated with high moment material for MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magneticStarting at: $691.00
PPP-NCSTR
Silicon probe with Al reflective coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: noneStarting at: $320.00
PPP-NCST
Silicon probe with no reflective coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: noneStarting at: $320.00
PPP-NCHAuD
Silicon probe with Au reflex coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $320.00
ATEC-NC
Silicon probe with visible tip apex.
f = 335 kHz | k = 45 N/m | tip coating: noneStarting at: $445.00
AR10T-NCH
Silicon probe with high aspect ratio (>10) tip for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $2,002.00
PPP-NCH
Silicon probe with no reflex coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $320.00
PPP-LM-MFMR
Silicon probe coated with low moment material for MFM on magnetic samples.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magneticStarting at: $691.00
PPP-NCSTAuD
Silicon probe with Au reflective coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: noneStarting at: $320.00
AR5-NCHR
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $889.00
AR10-NCH
Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $1,334.00
25Pt200B-H
Solid platinum probe for electrical measurements.
f = 100 kHz | k = 250 N/m | tip material: Pt
SSS-MFMR
Silicon probe coated with thin magnetic material for high resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magneticStarting at: $1,185.00
AR5T-NCHR
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $1,334.00
AR10T-NCHR
Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $2,002.00
PPP-NCLAuD
Silicon probe with long cantilevr and Au reflective coating for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: noneStarting at: $320.00
PPP-NCHAu
Conductive silicon probe with Au tip coating for electrical measurements in non-contact/tapping mode.
f = 330 kHz | k = 42 N/m | tip coating: AuStarting at: $384.00
SSS-NCHR
Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $757.00
ATEC-EFM
Conductive probe with visible tip apex for electrical measurements in modulation mode.
f = 85 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $890.00
PPP-RT-NCHR
Silicon probe with rotated tip and Al reflective coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $320.00
AR10-NCHR
Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $1,334.00
PPP-NCL
Silicon probe with long cantilever for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: noneStarting at: $320.00
PPP-LC-MFMR
Silicon probe coated with low coercivity material for MFM on soft magnetic samples.
f = 75 kHz | k = 2.8 N/m | tip coating: soft magneticStarting at: $691.00
AR5-NCH
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $889.00
PPP-NCLR
Silicon probe with long cantilever and Al reflective coating for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: noneStarting at: $320.00
CDT-NCHR
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 400 kHz | k = 80 N/m | tip coating: conductive diamondStarting at: $1,481.00
AR5T-NCH
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $1,334.00
SSS-NCH
Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $734.00
AR5-NCLR
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 190 kHz | k = 48 N/m | tip coating: noneStarting at: $889.00
PtSi-NCH
Sharp conductive probe with PtSi coating for electrical measurements.
f = 330 kHz | k = 42 N/m | tip coating: PtSiStarting at: $1,481.00
PPP-NCLAu
Conductive silicon probe with long cantilever for conductive measurements.
f = 190 kHz | k = 48 N/m | tip coating: AuStarting at: $384.00
DT-NCLR
Silicon probe with diamond coated tip and long cantilever for tip degrading samples.
f = 210 kHz | k = 72 N/m | tip coating: diamondStarting at: $1,185.00
SSS-NCLR
Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: noneStarting at: $757.00
PPP-NCHPt
Conductive probe for electrical measurements.
f = 330 kHz | k = 42 N/m | tip coating: Pt/IrStarting at: $449.00
CDT-NCLR
Silicon probe with conductive diamond coated tip and long cantilever for electrical measurements.
f = 210 kHz | k = 72 N/m | tip coating: conductive diamondStarting at: $1,481.00
ATEC-FMAu
Conductive probe with tip visible at end of lever.
f = 85 kHz | k = 2.8 N/m | tip coating: AuStarting at: $890.00
PPP-NCLPt
Conductive probe with long cantilever for electrical measurements.
f = 190 kHz | k = 48 N/m | tip coating: Pt/IrStarting at: $449.00
DT-NCHR
Silicon probe with diamond coated tip for tapping/non-contact mode on tip degrading samples.
f = 400 kHz | k = 80 N/m | tip coating: diamondStarting at: $1,185.00
SSS-NCL
Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: noneStarting at: $734.00
PPP-NCSTPt
Conductive probe for electrical measurements in soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: Pt/IrStarting at: $449.00
PL2-NCLR
Silicon probe with plateau tip with Al reflex coating.
f = 190 kHz | k = 48 N/m | tip coating: none
ATEC-NCAu
Conductive silicon probe with Au tip coating and visible tip apex.
f = 335 kHz | k = 45 N/m | tip coating: AuStarting at: $890.00
PL2-NCHR
Silicon probe with plateau tip with Al reflex coating.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $889.00
HA100WS
silicon nitride sharpened wedge tip for tapping mode in liquid.
f = 160 kHz | k = 15 N/m | tip coating: none
PL2-NCH
Silicon probe with plateau tip for non-contact/tapping mode.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $889.00
© 2016 Oxford Instruments Asylum Research, Inc. All Rights Reserved.
