Product was successfully added to your shopping cart.
Go to cart page
Continue
Probes
Sharp conductive probe with PtSi coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: PtSi
Silicon probe coated with high moment material for MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magnetic
Silicon probe coated with high moment material for MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magnetic
Silicon probe coated with low moment material for MFM on magnetic samples.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magnetic
Silicon probe coated with thin magnetic material for high resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magnetic
Silicon probe coated with low coercivity material for MFM on soft magnetic samples.
f = 75 kHz | k = 2.8 N/m | tip coating: soft magnetic
Solid platinum probe for electrical measurements.
f = 100 kHz | k = 250 N/m | tip material: Pt
Conductive probe with visible tip apex for electrical measurements in modulation mode.
f = 85 kHz | k = 2.8 N/m | tip coating: Pt/Ir
Silicon probe coated with low moment material for MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: soft magnetic
Conductive probe with tip visible at end of lever.
f = 85 kHz | k = 2.8 N/m | tip coating: Au
Silicon probe coated with thin magnetic material for high resolution MFM in vacuum.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magnetic
Silicon probe coated with low coercivity material for MFM in vacuum.
f = 75 kHz | k = 2.8 N/m | tip coating: soft magnetic
Please wait...
We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies from this website.