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Probes
Silicon probe with sharp tip for high resolution imaging in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with no reflective coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with no reflex coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with no reflex coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe without reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with visible tip apex.
f = 335 kHz | k = 45 N/m | tip coating: none
Silicon probe with high aspect ratio (>10) tip for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with no reflex coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with no reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with no reflex coating for contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with visible tip apex for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with long cantilever for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
f = 320 kHz | k = 42 N/m | tip coating: none
Silicon probe with short cantilever and no reflex coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with tip at the end of cantilever and no reflex coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with tip visible at end of lever for force modulation.
f = 85 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with no reflex coating for tapping/non-contact mode.
f = 320 kHz | k = 42 N/m | tip coating: none
Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with tip at the end of cantilever and no reflex coating for tapping/non-contact mode.
f = 285 kHz | k = 42 N/m | tip coating: none
Silicon probe with short cantilever without reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with tip at the end of cantilever and no reflex coating for contact mode.
f = 14 kHz | k =0.2 N/m | tip coating: none
Silicon probe with long cantilever and no reflex coating for tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with plateau tip for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with plateau tip.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with plateau tip for non-contact/tapping mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Tipless cantilever.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with plateau tip for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe; arrow shaped; tipless; single lever
Silicon probe; arrow shaped; tipless; eight levers at 250um pitch
Specially designed probes for high mechanical loads and scratch testing applications. Each probe comes with a calibrated spring constant and high resolution SEM showing the tip radius and cone angle.
f = 750 kHz | k = 350 N/m | tip coating: diamond tip
Specially designed probes for high mechanical loads and scratch testing applications.
For a similar probe but with a higher resolution tip, see NM-RC
f = 750 kHz | k = 350 N/m | tip coating: diamond tip
Silicon probe; arrow shaped; tipless; dual lever at 250um pitch
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