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Probes

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47 Item(s)

  1. SSS-FM

    Silicon probe with sharp tip for high resolution imaging in force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $757.00

  2. PtSi-FM

    Sharp conductive probe with PtSi coating for electrical measurements.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: PtSi

    Starting at: $1,481.00

  3. PPP-FM

    Silicon probe with no reflective coating for force modulation.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $320.00

  4. SMIM300-G5

    Nitride probe with shielded co-axial sensor specialized for sMIM applications.
    f = 19 kHz   |   k = 1 N/m   |   tip coating: TiW/Au

    Starting at: $750.00

  5. PPP-NCST

    Silicon probe with no reflective coating for soft tapping mode.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: none

    Starting at: $320.00

  6. FM

    Silicon probe with no reflex coating for force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $279.00

  7. PPP-NCH

    Silicon probe with no reflex coating for tapping/non contact mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $320.00

  8. PPP-CONT

    Silicon probe without reflective coating for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  9. ATEC-NC

    Silicon probe with visible tip apex.
    f = 335 kHz   |   k = 45 N/m   |   tip coating: none

    Starting at: $445.00

  10. SMIM150-G5

    Nitride probe with shielded co-axial sensor specialized for sMIM applications.
    f = 75 kHz   |   k = 8 N/m   |   tip coating: TiW/Au

    Starting at: $750.00

  11. AR10T-NCH

    Silicon probe with high aspect ratio (>10) tip for deep trench imaging.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $2,002.00

  12. NCST

    Silicon probe with no reflex coating for soft tapping mode.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: none

    Starting at: $279.00

  13. CONTSC

    Silicon probe with short cantilever and no reflex coating for contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $279.00

  14. Arrow FM

    Silicon probe with tip at the end of cantilever and no reflex coating for force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $245.00

  15. AR5-NCH

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $889.00

  16. ATEC-FM

    Silicon probe with tip visible at end of lever for force modulation.
    f = 85 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $445.00

  17. NCH

    Silicon probe with no reflex coating for tapping/non-contact mode.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $279.00

  18. AR10-NCH

    Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $1,334.00

  19. CONT

    Silicon probe with no reflex coating for contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $279.00

  20. SSS-NCH

    Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $699.00

  21. ATEC-CONT

    Silicon probe with visible tip apex for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $445.00

  22. PPP-NCL

    Silicon probe with long cantilever for tapping/non contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $320.00

  23. AR5T-NCH

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $1,334.00

  24. NW-SSS-NCH

    Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $699.00

  25. Arrow CONT

    Silicon probe with tip at the end of cantilever and no reflex coating for contact mode.
    f = 14 kHz   |   k =0.2 N/m   |   tip coating: none

    Starting at: $245.00

  26. AR5-NCL

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $889.00

  27. Arrow NC

    Silicon probe with tip at the end of cantilever and no reflex coating for tapping/non-contact mode.
    f = 285 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $245.00

  28. PtSi-NCH

    Sharp conductive probe with PtSi coating for electrical measurements.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: PtSi

    Starting at: $1,481.00

  29. PPP-CONTSC

    Silicon probe with short cantilever without reflective coating for contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  30. SSS-NCL

    Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $757.00

  31. PL2-CONT

    Silicon probe with plateau tip for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $889.00

  32. PtSi-CONT

    Silicon probe with PtSi coating for contact mode
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: PtSi

    Starting at: $1,481.00

  33. NW-SSS-NCL

    Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $699.00

  34. NCL

    Silicon probe with long cantilever and no reflex coating for tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $279.00

  35. PL2-NCH

    Silicon probe with plateau tip for non-contact/tapping mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $889.00

  36. PL2-NCL

    Silicon probe with plateau tip.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $889.00

  37. Arrow TL8Au

    Silicon probe; arrow shaped; tipless; eight levers at 250um pitch; Au coated

    Starting at: $1,400.00

  38. Arrow TL1Au

    Silicon probe; arrow shaped; tipless; single lever; Au coated

    Starting at: $900.00

  39. TL-NCH

    Tipless cantilever.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $320.00

  40. PL2-FM

    Silicon probe with plateau tip for force modulation.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $889.00

  41. Arrow TL1

    Silicon probe; arrow shaped; tipless; single lever

    Starting at: $900.00

  42. Arrow TL2Au

    Silicon probe; arrow shaped; tipless; dual lever at 250um pitch; Au coated

    Starting at: $900.00

  43. NM-TC

    Specially designed probes for high mechanical loads and scratch testing applications. Each probe includes a high resolution SEM showing the tip radius and cone angle, see QR code.
    f = 750 kHz   |   k = 350 N/m   |   tip coating: diamond tip

    Starting at: $1,250.00

    Ships in 4 Weeks

  44. Arrow TL2

    Silicon probe; arrow shaped; tipless; dual lever at 250um pitch

    Starting at: $900.00

  45. Arrow TL8

    Silicon probe; arrow shaped; tipless; eight levers at 250um pitch

    Starting at: $1,400.00

  46. AD-0.5-AS

    Contact mode with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
    f = 30 kHz   |   k = 0.5 N/m   |   tip coating: diamond tip

    Starting at: $2,000.00

  47. NM-RC-C

    Specially designed probes for high mechanical loads and scratch testing applications. Each probe comes with a calibrated spring constant and high resolution SEM showing the tip radius and cone angle.
    f = 750 kHz   |   k = 350 N/m   |   tip coating: diamond tip

    Starting at: $2,500.00

    Ships in 4 Weeks

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47 Item(s)