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Probes
Silicon probe with sharp tip for high resolution imaging in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
f = 320 kHz | k = 42 N/m | tip coating: none
Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with plateau tip for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with plateau tip for non-contact/tapping mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with plateau tip.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with plateau tip for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe; arrow shaped; tipless; single lever
Specially designed probes for high mechanical loads and scratch testing applications.
For a similar probe but with a higher resolution tip, see NM-RC
f = 750 kHz | k = 350 N/m | tip coating: diamond tip
Silicon probe; arrow shaped; tipless; dual lever at 250um pitch
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