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The Asylum Research Store and Support will be closed for the holidays 12/20/2019 - 1/2/2020
Probes
SSS-FM
Silicon probe with sharp tip for high resolution imaging in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: noneStarting at: $757.00
AR5-NCH
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $889.00
NW-SSS-NCH
Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
f = 320 kHz | k = 42 N/m | tip coating: noneStarting at: $699.00
SSS-NCH
Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $757.00
AR5-NCL
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 190 kHz | k = 48 N/m | tip coating: noneStarting at: $889.00
NW-SSS-NCL
Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: noneStarting at: $699.00
SSS-NCL
Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: noneStarting at: $757.00
PL2-CONT
Silicon probe with plateau tip for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: noneStarting at: $889.00
PL2-NCH
Silicon probe with plateau tip for non-contact/tapping mode.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $889.00
PL2-NCL
Silicon probe with plateau tip.
f = 190 kHz | k = 48 N/m | tip coating: noneStarting at: $889.00
PL2-FM
Silicon probe with plateau tip for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: noneStarting at: $889.00
NM-TC
Specially designed probes for high mechanical loads and scratch testing applications.For a similar probe but with a higher resolution tip, see NM-RC
f = 750 kHz | k = 350 N/m | tip coating: diamond tip
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