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Probes
Spherical EBID carbon AFM tips with various different radii for precise nanoindentation measurements and advanced data modelling.
tip radius = 20 - 2000 nm | k = 0.2 - 2000 N/m | tip coating: none
Silicon probe with plateau tip for non-contact/tapping mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with plateau tip with Al reflex coating.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with plateau tip with Al reflex coating.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with plateau tip.
f = 190 kHz | k = 48 N/m | tip coating: none
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