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The Asylum Research Store and Support will be closed for the holidays 12/20/2019 - 1/2/2020
Probes
PtSi-FM
Sharp conductive probe with PtSi coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: PtSiStarting at: $1,481.00
SC-10-M
CoNi side-coated tip silicon probe for high resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: CoNiStarting at: $1,190.00
SC-20-LM
Ni side-coated tip silicon probe for high resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: Ni
AR5T-NCHR
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $1,334.00
AR10-NCHR
Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $1,334.00
CDT-FMR
Silicon probe with conductive diamond coating for force modulation mode.
f = 105 kHz | k = 6.2 N/m | tip coating: conductive diamondStarting at: $1,481.00
SC-20-M
CoNi side-coated tip silicon probe for high hi-resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: CoNiStarting at: $1,025.00
AR5T-NCH
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $1,334.00
CDT-NCHR
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 400 kHz | k = 80 N/m | tip coating: conductive diamondStarting at: $1,481.00
SSS-MFMR
Silicon probe coated with thin magnetic material for high resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magneticStarting at: $1,185.00
AR10-NCH
Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $1,334.00
CDT-CONTR
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 20 kHz | k = 0.5 N/m | tip coating: conductive diamondStarting at: $1,481.00
PtSi-NCH
Sharp conductive probe with PtSi coating for electrical measurements.
f = 330 kHz | k = 42 N/m | tip coating: PtSiStarting at: $1,481.00
DT-FMR
Silicon probe with Al reflex coating and diamond coated tip for force modulation mode on tip degrading samples.
f = 105 kHz | k = 6.2 N/m | tip coating: diamondStarting at: $1,119.00
CDT-NCLR
Silicon probe with conductive diamond coated tip and long cantilever for electrical measurements.
f = 210 kHz | k = 72 N/m | tip coating: conductive diamondStarting at: $1,481.00
DT-NCHR
Silicon probe with diamond coated tip for tapping/non-contact mode on tip degrading samples.
f = 400 kHz | k = 80 N/m | tip coating: diamondStarting at: $1,185.00
DT-CONTR
Silicon probe with Al reflex coating and diamond coated tip for contact mode on tip degrading samples.
f = 20 kHz | k = 0.5 N/m | tip coating: diamondStarting at: $1,185.00
DT-NCLR
Silicon probe with diamond coated tip and long cantilever for tip degrading samples.
f = 210 kHz | k = 72 N/m | tip coating: diamondStarting at: $1,185.00
PtSi-CONT
Silicon probe with PtSi coating for contact mode
f = 13 kHz | k = 0.2 N/m | tip coating: PtSiStarting at: $1,481.00
SSS-QMFMR
Silicon probe coated with thin magnetic material for high resolution MFM in vacuum.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magneticStarting at: $1,334.00
PPP-QLC-MFMR
Silicon probe coated with low coercivity material for MFM in vacuum.
f = 75 kHz | k = 2.8 N/m | tip coating: soft magneticStarting at: $1,185.00
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