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Probes
Sharp conductive probe with PtSi coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: PtSi
CoNi side-coated tip silicon probe for high resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: CoNi
Ni side-coated tip silicon probe for high resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: Ni
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with conductive diamond coating for force modulation mode.
f = 105 kHz | k = 6.2 N/m | tip coating: conductive diamond
CoNi side-coated tip silicon probe for high hi-resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: CoNi
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 400 kHz | k = 80 N/m | tip coating: conductive diamond
Silicon probe coated with thin magnetic material for high resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magnetic
Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 20 kHz | k = 0.5 N/m | tip coating: conductive diamond
Sharp conductive probe with PtSi coating for electrical measurements.
f = 330 kHz | k = 42 N/m | tip coating: PtSi
Silicon probe with Al reflex coating and diamond coated tip for force modulation mode on tip degrading samples.
f = 105 kHz | k = 6.2 N/m | tip coating: diamond
Silicon probe with conductive diamond coated tip and long cantilever for electrical measurements.
f = 210 kHz | k = 72 N/m | tip coating: conductive diamond
Silicon probe with diamond coated tip for tapping/non-contact mode on tip degrading samples.
f = 400 kHz | k = 80 N/m | tip coating: diamond
Silicon probe with Al reflex coating and diamond coated tip for contact mode on tip degrading samples.
f = 20 kHz | k = 0.5 N/m | tip coating: diamond
Silicon probe with diamond coated tip and long cantilever for tip degrading samples.
f = 210 kHz | k = 72 N/m | tip coating: diamond
Silicon probe with PtSi coating for contact mode
f = 13 kHz | k = 0.2 N/m | tip coating: PtSi
Silicon probe coated with thin magnetic material for high resolution MFM in vacuum.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magnetic
Silicon probe coated with low coercivity material for MFM in vacuum.
f = 75 kHz | k = 2.8 N/m | tip coating: soft magnetic
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