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Probes
Also known as OTESPA; silicon probe with visible apex tip for tapping mode.
f = 300 kHz | k = 26 N/m | tip coating: none
Fast silicon probe with visible apex tip for fast imaging.
Only on AFMs with
small laser spot such as Cypher.
f = 1600 kHz | k = 85 N/m | tip coating: none
OTESPA with Au reflective coating; silicon probe with visible apex tip for tapping mode.
f = 300 kHz | k = 26 N/m | tip coating: none
Silicon probe with no reflex coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with Au reflex coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
EBD-TESPA: Diamond-like carbon probe with unrivaled lifetime. For uninterrupted AFM operation in tapping and non-contact mode in air.
f = 320 kHz | k = 40 N/m | tip coating: none
Silicon probe with visible tip apex.
f = 335 kHz | k = 45 N/m | tip coating: none
Silicon probe with Al reflective coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with long cantilever for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with Al reflex coating for tapping/non-contact mode.
f = 320 kHz | k = 42 N/m | tip coating: none
Silicon probe with rotated tip and Al reflective coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with long cantilevr and Au reflective coating for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with no reflex coating for tapping/non-contact mode.
f = 320 kHz | k = 42 N/m | tip coating: none
Silicon probe with long cantilever and Al reflective coating for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with tip at the end of cantilever and no reflex coating for tapping/non-contact mode.
f = 285 kHz | k = 42 N/m | tip coating: none
Silicon probe with tip at the end of cantilever and Al reflex coating for tapping/non-contact mode.
f = 285 kHz | k = 42 N/m | tip coating: none
Silicon probe with long cantilever and Al reflex coating for tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with long cantilever and no reflex coating for tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with XY-auto-alignment probes for non-contact /tapping mode application.
f = 330 kHz | k = 42 N/m | tip coating: none
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