Product was successfully added to your shopping cart.
Go to cart page
Continue
Probes
Also known as OLTESPA; medium soft cantilever for topgraphy and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
Also known as OSCM; conductive probe with visible apex tip for electrical measurement.
f = 70 kHz | k = 2 N/m | tip coating: Ti/Pt
OLTESPA with Au reflective coating; medium soft cantilever for topography and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
Silicon probe with PtIr coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/Ir
Silicon probe with no reflex coating for contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: none
Solid platinum probe for electrical measurements.
f = 4.5 kHz | k = 0.3 N/m | tip material: Pt
Silicon probe with short cantilever for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Al reflex coating for contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: none
Solid platinum probe for electrical measurements.
f = 9 kHz | k = 0.8 N/m | tip material: Pt
Silicon probe with short cantilever and no reflex coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Pyrex probe with single nitride cantilever and tip for bio applications
f = 67 kHz | k =0.32 N/m | tip coating: none
Silicon probe with tip at the end of cantilever and no reflex coating for contact mode.
f = 14 kHz | k =0.2 N/m | tip coating: none
Pyrex probe with two triangular gold coated nitride cantilevers and tip for life science applications.
f = 17 & 67 kHz | k = 0.08 & 0.32 N/m | tip coating: AU(35)
Pyrex probe with two diving board nitride cantilevers and tip for life science applications.
f = 17 & 67 kHz | k = 0.06 & 0.48 N/m | tip coating: none
Silicon probe with tip at the end of cantilever and AL reflex coating for contact mode.
f = 14 kHz | k =0.2 N/m | tip coating: none
Pyrex probe with two triangular nitride cantilevers and tip for life science applications.
f = 17 & 67 kHz | k = 0.08 & 0.32 N/m | tip coating: none
Test Conductive probe with visible tip apex for electrical measurements in contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: Pt/Ir
Silicon probe with tip at the end of cantilever and PtIr coating for contact mode.
f = 14 kHz | k =0.2 N/m | tip coating: PtIr
Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/Ir
Please wait...
We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies from this website.