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Probes
ASYELEC.01-R2
Asylum electrolever with visible tip apex and conductive coating for nano-electrical measurements
f = 75 kHz | k = 2.8 N/m | tip coating: Ti/IrStarting at: $350.00
AC240TS-R3
Also known as OLTESPA; medium soft cantilever for topgraphy and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: noneStarting at: $360.00
ASYMFMLC-R2
Silicon probe with visible tip apex and magnetic coating for low coercivity MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: permalloyStarting at: $375.00
ASYMFM-R2
Silicon probe with visible tip apex and magnetic coating for standard MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoCrStarting at: $325.00
ASYMFMLM-R2
Silicon probe with visible tip apex and magnetic coating for low moment MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoCrStarting at: $375.00
ASYMFMHM-R2
Silicon probe with visible tip apex and magnetic coating for high moment MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoCrStarting at: $375.00
ASYMFMHC-R2
Silicon probe with visible tip apex and magnetic coating for high coercivity MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoPt/FePtStarting at: $450.00
AC240TSA-R3
OLTESPA with Au reflective coating; medium soft cantilever for topography and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
AC240TM-R3
Also known as OSCM; conductive probe with visible apex tip for electrical measurement.
f = 70 kHz | k = 2 N/m | tip coating: Ti/PtStarting at: $400.00
PPP-EFM
Conductive probe for electrical measurements in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $449.00
EFM
Silicon probe with PtIr coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $419.00
PPP-CONTAuD
Silicon probe with Au reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: noneStarting at: $320.00
CONTSCR
Silicon probe with short cantilever for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: noneStarting at: $307.00
PPP-CONTSCAuD
Silicon probe with short cantilever and Au reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: noneStarting at: $320.00
CONTR
Silicon probe with Al reflex coating for contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: noneStarting at: $307.00
PNP-TRS
Pyrex probe with single nitride cantilever and tip for bio applications
f = 67 kHz | k =0.32 N/m | tip coating: none
PNP-TR
Pyrex probe with two triangular nitride cantilevers and tip for life science applications.
f = 17 & 67 kHz | k = 0.08 & 0.32 N/m | tip coating: noneStarting at: $440.00
PNP-TR-Au
Pyrex probe with two triangular gold coated nitride cantilevers and tip for life science applications.
f = 17 & 67 kHz | k = 0.08 & 0.32 N/m | tip coating: AU(35)Starting at: $480.00
PPP-FMAu
Conductive silicon probe with Au coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: AuStarting at: $384.00
Arrow CONTR
Silicon probe with tip at the end of cantilever and AL reflex coating for contact mode.
f = 14 kHz | k =0.2 N/m | tip coating: noneStarting at: $297.00
PNP-DB
Pyrex probe with two diving board nitride cantilevers and tip for life science applications.
f = 17 & 67 kHz | k = 0.06 & 0.48 N/m | tip coating: noneStarting at: $440.00
Arrow EFM
Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $407.00
PPP-CONTPt
Conductive probe for electrical measurements in contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: Pt/IrStarting at: $449.00
PPP-LFMR
Silicon probe for lateral force microscopy.
f = 23 kHz | k = 0.2 N/m | tip coating: noneStarting at: $320.00
PPP-CONTSCAu
Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
f = 23 kHz | k = 0.2 N/m | tip coating: AuStarting at: $384.00
CONTPt
Test Conductive probe with visible tip apex for electrical measurements in contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: Pt/Ir
PPP-CONTSCPt
Conductive probe with short cantilever for electrical measurements in contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: Pt/IrStarting at: $449.00
PPP-CONTAu
Conductive silicon probe with Au tip coating for contact mode electrical measurements.
f = 15 kHz | k = 0.2 N/m | tip coating: AuStarting at: $384.00
Arrow CONTPt
Silicon probe with tip at the end of cantilever and PtIr coating for contact mode.
f = 14 kHz | k =0.2 N/m | tip coating: PtIrStarting at: $407.00
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