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Probes
Also known as OTESPA; silicon probe with visible apex tip for tapping mode.
f = 300 kHz | k = 26 N/m | tip coating: none
Silicon probe with visible apex tip for force modulation or soft tapping on medium to hard samples.
f = 150 kHz | k =9 N/m | tip coating: none
Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
f = 285 kHz | k = 42 N/m | tip coating: Ti/Ir
OTESPA with Au reflective coating; silicon probe with visible apex tip for tapping mode.
f = 300 kHz | k = 26 N/m | tip coating: none
Fast silicon probe with visible apex tip for fast imaging.
Only on AFMs with
small laser spot such as Cypher.
f = 1600 kHz | k = 85 N/m | tip coating: none
Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
f = 300 kHz | k = 42 N/m | tip coating: Ti/Ir
Silicon probe with no reflex coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
200 nm long carbon tip with 2 nm radius on soft qp-BioAC probe; Designed for gentle, high resolution bioimaging.
f = 50 kHz | k = 0.1 N/m | tip coating: none
Silicon probe with Al reflective coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with no reflex coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with Al reflective coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Fast scanning probe with full carbon tip; for ultrafast high resolution bioimaging.
f = 1200 kHz | k = 18 N/m | tip coating: none
Silicon probe with PtIr coating for tapping/non-contact mode.
f = 320 kHz | k = 42 N/m | tip coating: Pt/Ir
EBD-TESPA: Diamond-like carbon probe with unrivaled lifetime. For uninterrupted AFM operation in tapping and non-contact mode in air.
f = 320 kHz | k = 40 N/m | tip coating: none
Silicon probe with Al reflex coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with visible tip apex.
f = 335 kHz | k = 45 N/m | tip coating: none
Carbon tip with 25 nm radius on soft qp-BioAC quartz probe; For gentle imaging of force-sensitive samples.
f = 50 kHz | k = 0.1 N/m | tip coating: none
Silicon probe with Au reflex coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with no reflective coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with Al reflex coating for tapping/non-contact mode.
f = 320 kHz | k = 42 N/m | tip coating: none
Silicon probe with rotated tip and Al reflective coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with long cantilevr and Au reflective coating for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Conductive silicon probe with Au tip coating for electrical measurements in non-contact/tapping mode.
f = 330 kHz | k = 42 N/m | tip coating: Au
Solid platinum probe for electrical measurements.
f = 4.5 kHz | k = 0.3 N/m | tip material: Pt
Silicon probe with long cantilever for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with no reflex coating for tapping/non-contact mode.
f = 320 kHz | k = 42 N/m | tip coating: none
Silicon probe with Au reflective coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with long cantilever and Al reflective coating for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with PtIr coating for contact mode.
f = 285 kHz | k = 42 N/m | tip coating: Pt/Ir
Conductive silicon probe with long cantilever for conductive measurements.
f = 190 kHz | k = 48 N/m | tip coating: Au
Silicon probe with tip at the end of cantilever and Al reflex coating for tapping/non-contact mode.
f = 285 kHz | k = 42 N/m | tip coating: none
Conductive probe with Au coating for soft tapping mode electrical measurements.
f = 160 kHz | k = 7.4 N/m | tip coating: Au
Silicon probe with long cantilever and PtIr coating for tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: PtIr
Silicon probe with tip at the end of cantilever and no reflex coating for tapping/non-contact mode.
f = 285 kHz | k = 42 N/m | tip coating: none
Conductive probe with long cantilever for electrical measurements.
f = 190 kHz | k = 48 N/m | tip coating: Pt/Ir
Silicon probe with long cantilever and no reflex coating for tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Conductive probe for electrical measurements in soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: Pt/Ir
Silicon probe with long cantilever and Al reflex coating for tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Conductive probe for electrical measurements.
f = 330 kHz | k = 42 N/m | tip coating: Pt/Ir
Tipless cantilever.
f = 330 kHz | k = 42 N/m | tip coating: none
Tipless long cantilever.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with XY auto-alignment for soft tapping.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with XY-auto-alignment probes for non-contact /tapping mode application.
f = 330 kHz | k = 42 N/m | tip coating: none
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