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Probes
Also known as OSCM; conductive probe with visible apex tip for electrical measurement.
f = 70 kHz | k = 2 N/m | tip coating: Ti/Pt
Silicon probe with PtIr coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/Ir
Silicon probe with PtIr coating for tapping/non-contact mode.
f = 320 kHz | k = 42 N/m | tip coating: Pt/Ir
Solid platinum probe for electrical measurements.
f = 4.5 kHz | k = 0.3 N/m | tip material: Pt
Solid platinum probe for electrical measurements.
f = 9 kHz | k = 0.8 N/m | tip material: Pt
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: Pt
Solid platinum probe for electrical measurements.
f = 100 kHz | k = 250 N/m | tip material: Pt
Silicon probe with PtIr coating for contact mode.
f = 285 kHz | k = 42 N/m | tip coating: Pt/Ir
Silicon probe with long cantilever and PtIr coating for tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: PtIr
Silicon probe with tip at the end of cantilever and PtIr coating for contact mode.
f = 14 kHz | k =0.2 N/m | tip coating: PtIr
Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/Ir
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