Americas
North America
South America
Canada
Australia
The Asylum Research Store and Support will be closed for the holidays 12/20/2019 - 1/2/2020
Probes
PPP-EFM
Conductive probe for electrical measurements in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $449.00
PPP-NCHAu
Conductive silicon probe with Au tip coating for electrical measurements in non-contact/tapping mode.
f = 330 kHz | k = 42 N/m | tip coating: AuStarting at: $384.00
PPP-NCSTAu
Conductive probe with Au coating for soft tapping mode electrical measurements.
f = 160 kHz | k = 7.4 N/m | tip coating: AuStarting at: $384.00
PPP-NCLAu
Conductive silicon probe with long cantilever for conductive measurements.
f = 190 kHz | k = 48 N/m | tip coating: AuStarting at: $384.00
PPP-FMAu
Conductive silicon probe with Au coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: AuStarting at: $384.00
PPP-CONTPt
Conductive probe for electrical measurements in contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: Pt/IrStarting at: $449.00
PPP-NCHPt
Conductive probe for electrical measurements.
f = 330 kHz | k = 42 N/m | tip coating: Pt/IrStarting at: $449.00
PPP-CONTSCPt
Conductive probe with short cantilever for electrical measurements in contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: Pt/IrStarting at: $449.00
PPP-NCLPt
Conductive probe with long cantilever for electrical measurements.
f = 190 kHz | k = 48 N/m | tip coating: Pt/IrStarting at: $449.00
PPP-CONTSCAu
Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
f = 23 kHz | k = 0.2 N/m | tip coating: AuStarting at: $384.00
PPP-NCSTPt
Conductive probe for electrical measurements in soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: Pt/IrStarting at: $449.00
© 2016 Oxford Instruments Asylum Research, Inc. All Rights Reserved.
