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PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Au coating (Detector Side)
The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-NCHAuD probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
The probe offers unique features:
• Guaranteed tip radius of curvature < 10 nm
• Tip height 10 - 15 µm
• Highly doped silicon to dissipate static charge
• Au coating on detector side of cantilever
• Chemically inert
A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.
Spring k (N/m
42 (10 - 130)
330 (204 - 497)
125 (115 - 135)
30 (22.5 - 37.5)
4.0 (3.0 - 5.0)
Reflex Coating (nm)
Tip radius (nm)
Tip height (µm)
12.5 +/- 2.5
Front angle (°)
25 +/- 2
Back angle (°)
15 +/- 2
Side angle (°)
22.5 +/- 2
Tip coating (nm)
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