PPP-LFMR

PointProbe® Plus Lateral Force Microscopy - Reflex Coating

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
For lateral or friction force microscopy NANOSENSORS™ offers a special type of AFM probe (LFM: lateral force microscopy). This sensor type is optimized for a high sensitivity to lateral or friction forces by an extremely soft, thin cantilever.

The probe offers unique features:

guaranteed tip radius of curvature < 10 nm

tip height 10 - 15 µm

highly doped silicon to dissipate static charge

Al coating on detector side of cantilever

high mechanical Q-factor for high sensitivity

alignment grooves on backside of silicon holder chip

precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip

compatible with PointProbe® Plus XY-Alignment Series

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.

Cantilever Specifications
Spring k (N/m	0.2 (0.01 - 1.87)
Freq (kHz)	23 (1 - 57)
Length (µm)	225 (215 - 235)
Width (µm)	48 (40 - 55)
Thickness (µm)	1.0 (0.1 - 2.0)
Shape	rectangular
Material	Silicon
Reflex Coating (nm)	Al (30)

Tip Specifications
Tip radius (nm)	7
Tip height (µm)	12.5 +/- 2.5
Front angle (°)	25 +/- 2
Back angle (°)	15 +/- 2
Side angle (°)	22.5 +/- 2
Tip shape	4-sided
Tip material	Silicon
Tip coating (nm)	none