Details
PointProbe® Plus Contact Mode - Au Coating (Detector side)
The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-CONTAuD probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
The probe offers unique features:
guaranteed tip radius of curvature < 10 nm
tip height 10 - 15 µm
highly doped silicon to dissipate static charge
Au coating on detector side of cantilever
chemically inert
Cantilever Specifications
|
Spring k (N/m |
0.2 (0.02 - 0.77)
|
Freq (kHz) |
13 (6 - 21)
|
Length (µm) |
450 (440 - 460)
|
Width (µm) |
50 (42.5 - 57.5)
|
Thickness (µm) |
2.0 (1.0 - 3.0)
|
Shape |
rectangular
|
Material |
Silicon
|
Reflex Coating (nm) |
Cr/Au (5/35)
|
Tip Specifications
|
Tip radius (nm) |
7
|
Tip height (µm) |
12.5 +/- 2.5
|
Front angle (°) |
25 +/- 2
|
Back angle (°) |
15 +/- 2
|
Side angle (°) |
22.5 +/- 2
|
Tip shape |
4-sided
|
Tip material |
Silicon
|
Tip coating (nm) |
none
|
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