Americas
North America
South America
Canada
Australia
Details
PLateau Tip - Non-Contact / Tapping Mode - High Resonance Frequency
The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.
The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.
| Cantilever Specifications | |
|---|---|
| Spring k (N/m | 42 (10 - 130) |
| Freq (kHz) | 330 (204 - 497) |
| Length (µm) | 125 (115 - 135) |
| Width (µm) | 30 (22.5 - 37.5) |
| Thickness (µm) | 4.0 (3.0 - 5.0) |
| Shape | Rectangular |
| Material | Silicon |
| Reflex Coating (nm) | None |
| Tip Specifications | |
|---|---|
| Tip radius (nm) | 900 |
| Tip height (µm) | 12.5 +/- 2.5 |
| Front angle (°) | 20 +/- 2 |
| Back angle (°) | 20 +/- 2 |
| Side angle (°) | 20 +/- 2 |
| Tip shape | 8-sided |
| Tip material | Silicon |
| Tip coating (nm) | None |
| Tip Spike Specifications | |
|---|---|
| Spike radius (nm) | 1025 +/- 125 |
| Spike height (µm) | 2 +/- 0.5 |
| Spike tilt (°) | 0 +/- 1 |
| Spike ½ angle (°) | 0 +/- 1 |
| Spike shape | post |
| Spike material | Silicon |
Additional Information
| Tip Radius | 900 |
|---|---|
| Tip Radius | > 20 nm |
| Spring Constant | 42 |
| Frequency | 330 |
| Compatibility | No |
| Manufacturer | Nanosensors |
FAST SHIPPING
Most orders shipped within 24 hours on business days.
MONEY BACK
Contact us for a replacement or refund
© 2016 Oxford Instruments Asylum Research, Inc. All Rights Reserved.