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Quick Overview

Silicon probe with plateau tip and Al reflective coating for force modulation.

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none
Product Name Price Qty
PL2-FMR (10 Pack)
(Ships in 1-2 Weeks)


PLateau Tip - Force Modulation Mode - Reflex Coating

The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.
The PL2-FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

Cantilever Specifications
Spring k (N/m 2.8 (0.5 - 9.5)
Freq (kHz) 75 (45 - 115)
Length (µm) 225 (215 - 235)
Width (µm) 28 (20 - 35)
Thickness (µm) 3.0 (2.0 - 4.0)
Shape rectangular
Material Silicon
Reflex Coating (nm) Al

Tip Specifications
Tip radius (nm) -
Tip height (µm) 12.5 +/- 2.5
Front angle (°) 20 +/- 2
Back angle (°) 20 +/- 2
Side angle (°) 20 +/- 2
Tip shape 8-sided
Tip material Silicon
Tip coating (nm) none

Tip Spike Specifications
Spike radius (nm) 900 +/- 250
Spike height (µm) >2
Spike tilt (°) 0 +/- 1
Spike ½ angle (°) 0 +/- 1
Spike shape post
Spike material Silicon

Untitled Document

Additional Information

Tip Radius 900
Tip Radius > 20 nm
Spring Constant 2.8
Frequency 75
Compatibility No
Manufacturer Nanosensors

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