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Probes
ASYELEC.02-R2
Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
f = 285 kHz | k = 42 N/m | tip coating: Ti/IrStarting at: $350.00
ASYELEC.02
Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
f = 300 kHz | k = 42 N/m | tip coating: Ti/IrStarting at: $350.00
AD-40-AS
with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 180 kHz | k = 40 N/m | tip coating: diamond tip
NCHPt
Silicon probe with PtIr coating for tapping/non-contact mode.
f = 320 kHz | k = 42 N/m | tip coating: Pt/IrStarting at: $419.00
AD-40-SS
Tapping mode probe with a super sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 180 kHz | k = 40 N/m | tip coating: diamond tip
25PT300B
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: PtStarting at: $400.00
CDT-NCHR
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 400 kHz | k = 80 N/m | tip coating: conductive diamondStarting at: $1,481.00
NW-CDT-NCHR
Nanoworld silicon probe with conductive diamond coating for tapping/non-contact mode.
f = 400 kHz | k = 80 N/m | tip coating: conductive diamondStarting at: $1,399.00
12PT300B
Solid platinum probe for electrical measurements.
f = 9 kHz | k = 0.8 N/m | tip material: PtStarting at: $400.00
25Pt200B-H
Solid platinum probe for electrical measurements.
f = 100 kHz | k = 250 N/m | tip material: Pt
25PT300B-10
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: PtStarting at: $500.00
PtSi-NCH
Sharp conductive probe with PtSi coating for electrical measurements.
f = 330 kHz | k = 42 N/m | tip coating: PtSiStarting at: $1,481.00
NCLPt
Silicon probe with long cantilever and PtIr coating for tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: PtIrStarting at: $419.00
Arrow NCPt
Silicon probe with PtIr coating for contact mode.
f = 285 kHz | k = 42 N/m | tip coating: Pt/IrStarting at: $370.00
NW-CDT-NCLR
Nanoworld silicon probe with long cantilever and conductive diamond coating for tapping/non-contact mode.
f = 210 kHz | k = 72 N/m | tip coating: conductive diamondStarting at: $1,399.00
PPP-NCHPt
Conductive probe for electrical measurements.
f = 330 kHz | k = 42 N/m | tip coating: Pt/IrStarting at: $449.00
CDT-NCLR
Silicon probe with conductive diamond coated tip and long cantilever for electrical measurements.
f = 210 kHz | k = 72 N/m | tip coating: conductive diamondStarting at: $1,481.00
PPP-NCLPt
Conductive probe with long cantilever for electrical measurements.
f = 190 kHz | k = 48 N/m | tip coating: Pt/IrStarting at: $449.00
ATEC-NCPt
Conductive probe with visible tip apex for electrical measurements.
f = 335 kHz | k = 45 N/m | tip coating: Pt/IrStarting at: $890.00
NM-RC-C
Specially designed probes for high mechanical loads and scratch testing applications. Each probe comes with a calibrated spring constant and high resolution SEM showing the tip radius and cone angle.
f = 750 kHz | k = 350 N/m | tip coating: diamond tip
NM-TC
Specially designed probes for high mechanical loads and scratch testing applications.For a similar probe but with a higher resolution tip, see NM-RC
f = 750 kHz | k = 350 N/m | tip coating: diamond tip
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