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Probes
Silicon probe coated with high moment material for MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magnetic
CoNi side-coated tip silicon probe for high resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: CoNi
Ni side-coated tip silicon probe for high resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: Ni
Silicon probe coated with thin magnetic material for high resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magnetic
CoNi side-coated tip silicon probe for high hi-resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: CoNi
CoNi side-coated tip silicon probe for high hi-resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: CoNi
Silicon probe coated with low coercivity material for MFM on soft magnetic samples.
f = 75 kHz | k = 2.8 N/m | tip coating: soft magnetic
Ni side-coated tip silicon probe for high hi-resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: Ni
Silicon probe coated with high moment material for MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magnetic
Silicon probe coated with low moment material for MFM on magnetic samples.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magnetic
Silicon probe coated with low moment material for MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: soft magnetic
Silicon probe coated with thin magnetic material for high resolution MFM in vacuum.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magnetic
Silicon probe coated with low coercivity material for MFM in vacuum.
f = 75 kHz | k = 2.8 N/m | tip coating: soft magnetic
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