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Probes

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Items 151 to 200 of 213 total

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  1. PPP-CONTAu

    Conductive silicon probe with Au tip coating for contact mode electrical measurements.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: $384.00

  2. NW-AR5-NCLR

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $839.00

  3. PPP-LFMR

    Silicon probe for lateral force microscopy.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  4. DT-NCHR

    Silicon probe with diamond coated tip for tapping/non-contact mode on tip degrading samples.
    f = 400 kHz   |   k = 80 N/m   |   tip coating: diamond

    Starting at: $1,185.00

  5. NW-DT-FMR

    Silicon probe with Al reflex coating and diamond coated tip for force modulation mode on tip degrading samples.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: diamond

    Starting at: $1,119.00

  6. DT-CONTR

    Silicon probe with Al reflex coating and diamond coated tip for contact mode on tip degrading samples.
    f = 20 kHz   |   k = 0.5 N/m   |   tip coating: diamond

    Starting at: $1,185.00

  7. PPP-NCHPt

    Conductive probe for electrical measurements.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

  8. NCLR

    Silicon probe with long cantilever and Al reflex coating for tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $307.00

  9. NW-SSS-NCL

    Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $699.00

  10. PL2-CONTR

    Silicon probe with Al reflective coating and plateau tip for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $889.00

  11. Arrow CONTPt

    Silicon probe with tip at the end of cantilever and PtIr coating for contact mode.
    f = 14 kHz   |   k =0.2 N/m   |   tip coating: PtIr

    Starting at: $370.00

  12. SSS-NCL

    Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $757.00

  13. NW-S-MFMR

    Silicon probe coated with low moment material for MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: soft magnetic

    Starting at: $615.00

  14. PtSi-CONT

    Silicon probe with PtSi coating for contact mode
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: PtSi

    Starting at: $1,481.00

  15. PPP-CONTSCPt

    Conductive probe with short cantilever for electrical measurements in contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

  16. CONTPt

    Test Conductive probe with visible tip apex for electrical measurements in contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: $419.00

    Ships in 1-2 Weeks

  17. DT-NCLR

    Silicon probe with diamond coated tip and long cantilever for tip degrading samples.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: diamond

    Starting at: $1,185.00

  18. NW-DT-NCHR

    Silicon probe with diamond coated tip for tapping/non-contact mode on tip degrading samples.
    f = 400 kHz   |   k = 80 N/m   |   tip coating: diamond

    Starting at: $1,119.00

  19. PPP-NCLPt

    Conductive probe with long cantilever for electrical measurements.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

  20. PPP-CONTSCAu

    Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: $384.00

  21. Arrow EFM

    Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: $370.00

  22. DT-FMR

    Silicon probe with Al reflex coating and diamond coated tip for force modulation mode on tip degrading samples.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: diamond

    Starting at: $1,119.00

  23. CDT-NCLR

    Silicon probe with conductive diamond coated tip and long cantilever for electrical measurements.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: conductive diamond

    Starting at: $1,481.00

  24. SSS-NCLR

    Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $757.00

  25. NCL

    Silicon probe with long cantilever and no reflex coating for tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $279.00

  26. ATEC-CONTPt

    Conductive probe with visible tip apex for electrical measurements in contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: $890.00

  27. PL2-CONT

    Silicon probe with plateau tip for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $889.00

  28. NW-DT-NCLR

    Silicon probe with diamond coated tip and long cantilever for tip degrading samples.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: diamond

    Starting at: $1,119.00

  29. PPP-NCSTPt

    Conductive probe for electrical measurements in soft tapping mode.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

  30. PPP-QFMR

    High Q silicon probe with Al reflective coating for force modulation in vacuum.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $640.00

  31. PL2-NCL

    Silicon probe with plateau tip.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $889.00

  32. ASY.STM.PKG

    Platinum/Iridium (80/20) mechanically formed tip for STM application.
    Dia = 0.01"   |   lngth = 0.28"   |   tip material: Pt

    Starting at: $300.00

  33. HA100WS

    silicon nitride sharpened wedge tip for tapping mode in liquid.
    f = 160 kHz   |   k = 15 N/m   |   tip coating: none

    Starting at: $1,750.00

    Ships in 1-2 Weeks

  34. ATEC-NCAu

    Conductive silicon probe with Au tip coating and visible tip apex.
    f = 335 kHz   |   k = 45 N/m   |   tip coating: Au

    Starting at: $890.00

  35. ATEC-NCPt

    Conductive probe with visible tip apex for electrical measurements.
    f = 335 kHz   |   k = 45 N/m   |   tip coating: Pt/Ir

    Starting at: $890.00

  36. PL2-NCLR

    Silicon probe with plateau tip with Al reflex coating.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $889.00

    Ships in 1-2 Weeks

  37. PL2-NCH

    Silicon probe with plateau tip for non-contact/tapping mode.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $889.00

  38. PL2-NCHR

    Silicon probe with plateau tip with Al reflex coating.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $889.00

  39. TL-CONT

    Tipless soft cantilever.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  40. PPP-XYCONTR

    Silicon probe with XY auto-alignment and Al reflective coating for contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  41. PPP-XYNCHR

    Silicon probe with XY-auto-alignment probes for non-contact /tapping mode application.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $320.00

  42. Arrow TL1Au

    Silicon probe; arrow shaped; tipless; single lever; Au coated

    Starting at: $900.00

  43. TL-NCL

    Tipless long cantilever.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $320.00

  44. PNP-TR-TL-Au

    Nitride probe; tipless; 2 levers; Au reflex/tip coated

    Starting at: $480.00

  45. PL2-FM

    Silicon probe with plateau tip for force modulation.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $889.00

  46. SSS-QMFMR

    Silicon probe coated with thin magnetic material for high resolution MFM in vacuum.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: hard magnetic

    Starting at: $1,334.00

  47. PPP-QNCHR

    Silicon probe with high Q and Al reflective coating for tapping/non contact mode in vacuum.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $640.00

  48. TL-FM

    Tipless cantilever.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none

    Starting at: $320.00

  49. Arrow TL8Au

    Silicon probe; arrow shaped; tipless; eight levers at 250um pitch; Au coated

    Starting at: $1,400.00

  50. PPP-QLC-MFMR

    Silicon probe coated with low coercivity material for MFM in vacuum.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: soft magnetic

    Starting at: $1,185.00

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Items 151 to 200 of 213 total

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