Details
Non-contact / Tapping™ mode - Long Cantilever - PtIr5 coating
NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
The tip radius of curvature is less than 25 nm.
Cantilever Specifications
|
Spring k (N/m |
48 (31 - 71)
|
Freq (kHz) |
190 (160 - 210)
|
Length (µm) |
225 (220 - 230)
|
Width (µm) |
38 (33 - 43)
|
Thickness (µm) |
7.0 (6.5 - 7.5)
|
Shape |
rectangular
|
Material |
Silicon
|
Reflex Coating (nm) |
Cr/PtIr (5/25)
|
Tip Specifications
|
Tip radius (nm) |
25
|
Tip height (µm) |
12.5 +/- 2.5
|
Front angle (°) |
25 +/- 2
|
Back angle (°) |
15 +/- 2
|
Side angle (°) |
22.5 +/- 2
|
Tip shape |
4-sided
|
Tip material |
Silicon
|
Tip coating (nm) |
Cr/PtIr (5/25)
|
Untitled Document