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Probes
Also known as OTESPA; silicon probe with visible apex tip for tapping mode.
f = 300 kHz | k = 26 N/m | tip coating: none
Silicon probe with visible apex tip for force modulation or soft tapping on medium to hard samples.
f = 150 kHz | k =9 N/m | tip coating: none
Also known as OLTESPA; medium soft cantilever for topgraphy and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
Silicon probe with visible tip apex and Au reflex coating for high speed imaging.
f = 1500 kHz | tip coating: none
Silicon probe with visible tip apex and Al reflex coating for high speed imaging.
f = 2000 kHz | tip coating: none
Silicon probe with visible tip apex and Al reflex coating for high speed imaging.
f = 1500 kHz | tip coating: none
Silicon probe with Al reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with short cantilever and Al reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Al reflective coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with Al reflective coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with short cantilever for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with long cantilever and Al reflective coating for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with rotated tip and Al reflective coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with Al reflex coating for contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: none
Silicon probe for lateral force microscopy.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Al reflective coating and plateau tip for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with XY-auto-alignment probes for non-contact /tapping mode application.
f = 330 kHz | k = 42 N/m | tip coating: none
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