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Probes
Silicon probe with Al reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with Al reflective coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with long cantilever and Al reflective coating for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with rotated tip and Al reflective coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with rotated tip for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with Al reflective coating and plateau tip for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Al reflex coating and diamond coated tip for force modulation mode on tip degrading samples.
f = 105 kHz | k = 6.2 N/m | tip coating: diamond
Silicon probe with plateau tip with Al reflex coating.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with plateau tip with Al reflex coating.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with XY-auto-alignment probes for non-contact /tapping mode application.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with XY auto-alignment for soft tapping.
f = 160 kHz | k = 7.4 N/m | tip coating: none
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