Product was successfully added to your shopping cart.
Go to cart page
Continue
Probes
Silicon probe with visible tip apex and Au reflex coating for high speed imaging.
f = 2000 kHz | tip coating: none
Silicon probe with visible tip apex and Al reflex coating for high speed imaging.
f = 2000 kHz | tip coating: none
Silicon probe with diamond coated tip and long cantilever for tip degrading samples.
f = 210 kHz | k = 72 N/m | tip coating: diamond
Silicon probe with diamond coated tip for tapping/non-contact mode on tip degrading samples.
f = 400 kHz | k = 80 N/m | tip coating: diamond
Please wait...
We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies from this website.