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Probes
EBD-TESPA: Diamond-like carbon probe with unrivaled lifetime. For uninterrupted AFM operation in tapping and non-contact mode in air.
f = 320 kHz | k = 40 N/m | tip coating: none
Supersharp EBID carbon AFM probe with 2 nm tip radius on soft 0.4 N/m cantilever.
f = 60 kHz | k = 0.4 N/m | tip coating: none
15 um long carbon tip with 25 nm radius on soft qp-BioAC cantilever; For enhanced accessibility to subjacent regions of tall biosamples.
f = 50 kHz | k = 0.1 N/m | tip coating: none
Fast scanning probe with full carbon tip; for ultrafast high resolution bioimaging.
f = 1200 kHz | k = 18 N/m | tip coating: none
CoNi side-coated tip silicon probe for high resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: CoNi
Spherical EBID carbon AFM tips with various different radii for precise nanoindentation measurements and advanced data modelling.
tip radius = 20 - 2000 nm | k = 0.2 - 2000 N/m | tip coating: none
High performance EBID carbon AFM probe with guaranteed tip radius of 6-7 nm on soft 0.4 N/m cantilever.
f = 60 kHz | k = 0.4 N/m | tip coating: none
EBD-FESPA: Diamond-like carbon probe with unrivaled lifetime. For uninterrupted AFM imaging in gentle tapping and non-contact mode in air.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Carbon tip with 25 nm radius on soft qp-BioAC quartz probe; For gentle imaging of force-sensitive samples.
f = 50 kHz | k = 0.1 N/m | tip coating: none
200 nm long carbon tip with 2 nm radius on soft qp-BioAC probe; Designed for gentle, high resolution bioimaging.
f = 50 kHz | k = 0.1 N/m | tip coating: none
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: Pt
CoNi side-coated tip silicon probe for high hi-resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: CoNi
Solid platinum probe for electrical measurements.
f = 9 kHz | k = 0.8 N/m | tip material: Pt
Solid platinum probe for electrical measurements.
f = 4.5 kHz | k = 0.3 N/m | tip material: Pt
Ni side-coated tip silicon probe for high hi-resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: Ni
Solid platinum probe for electrical measurements.
f = 100 kHz | k = 250 N/m | tip material: Pt
Ni side-coated tip silicon probe for high resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: Ni
Solid platinum probe for electrical measurements.
f = 10 kHz | k = 8 N/m | tip material: Pt
CoNi side-coated tip silicon probe for high hi-resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: CoNi
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: Pt
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