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Probes
Also known as OTESPA; silicon probe with visible apex tip for tapping mode.
f = 300 kHz | k = 26 N/m | tip coating: none
OTESPA with Au reflective coating; silicon probe with visible apex tip for tapping mode.
f = 300 kHz | k = 26 N/m | tip coating: none
Fast silicon probe with visible apex tip for fast imaging.
Only on AFMs with
small laser spot such as Cypher.
f = 1600 kHz | k = 85 N/m | tip coating: none
15 um long carbon tip with 25 nm radius on soft qp-BioAC cantilever; For enhanced accessibility to subjacent regions of tall biosamples.
f = 50 kHz | k = 0.1 N/m | tip coating: none
Carbon tip with 25 nm radius on soft qp-BioAC quartz probe; For gentle imaging of force-sensitive samples.
f = 50 kHz | k = 0.1 N/m | tip coating: none
EBD-TESPA: Diamond-like carbon probe with unrivaled lifetime. For uninterrupted AFM operation in tapping and non-contact mode in air.
f = 320 kHz | k = 40 N/m | tip coating: none
200 nm long carbon tip with 2 nm radius on soft qp-BioAC probe; Designed for gentle, high resolution bioimaging.
f = 50 kHz | k = 0.1 N/m | tip coating: none
Fast scanning probe with full carbon tip; for ultrafast high resolution bioimaging.
f = 1200 kHz | k = 18 N/m | tip coating: none
Solid platinum probe for electrical measurements.
f = 9 kHz | k = 0.8 N/m | tip material: Pt
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: Pt
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: Pt
silicon nitride sharpened wedge tip for tapping mode in liquid.
f = 160 kHz | k = 15 N/m | tip coating: none
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