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Probes
Also known as OLTESPA; medium soft cantilever for topgraphy and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
Also known as OSCM; conductive probe with visible apex tip for electrical measurement.
f = 70 kHz | k = 2 N/m | tip coating: Ti/Pt
OLTESPA with Au reflective coating; medium soft cantilever for topography and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
Nitride probe with shielded co-axial sensor specialized for sMIM applications.
f = 75 kHz | k = 8 N/m | tip coating: TiW/Au
High performance EBID carbon AFM probe with guaranteed tip radius of 6-7 nm on soft 0.4 N/m cantilever.
f = 60 kHz | k = 0.4 N/m | tip coating: none
Nitride probe with shielded co-axial sensor specialized for sMIM applications.
f = 19 kHz | k = 1 N/m | tip coating: TiW/Au
EBD-FESPA: Diamond-like carbon probe with unrivaled lifetime. For uninterrupted AFM imaging in gentle tapping and non-contact mode in air.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Supersharp EBID carbon AFM probe with 2 nm tip radius on soft 0.4 N/m cantilever.
f = 60 kHz | k = 0.4 N/m | tip coating: none
Solid platinum probe for electrical measurements.
f = 100 kHz | k = 250 N/m | tip material: Pt
Solid platinum probe for electrical measurements.
f = 10 kHz | k = 8 N/m | tip material: Pt
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: Pt
Solid platinum probe for electrical measurements.
f = 9 kHz | k = 0.8 N/m | tip material: Pt
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: Pt
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