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Probes
AC10DS
BioLever fast (also known as BL-AC10DS); ultra small cantilever for tapping mode in liquid.
Only on AFMs with small laser spot such as Cypher.
f = 1500 kHz | k = 0.1 N/m | tip coating: noneStarting at: $600.00
PtSi-FM
Sharp conductive probe with PtSi coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: PtSiStarting at: $1,481.00
qp-BioAC-CI
Quartz like probe with three cantilevers for contact mode.
f = 30 & 50 & 90 kHz | k = 0.06 & 0.1 & 0.3 N/m | tip coating: noneStarting at: $495.00
PPP-EFM
Conductive probe for electrical measurements in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $449.00
PPP-MFMR
Silicon probe coated with high moment material for MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magneticStarting at: $691.00
PPP-LM-MFMR
Silicon probe coated with low moment material for MFM on magnetic samples.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magneticStarting at: $691.00
PPP-NCHAu
Conductive silicon probe with Au tip coating for electrical measurements in non-contact/tapping mode.
f = 330 kHz | k = 42 N/m | tip coating: AuStarting at: $384.00
CDT-NCHR
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 400 kHz | k = 80 N/m | tip coating: conductive diamondStarting at: $1,481.00
PPP-LC-MFMR
Silicon probe coated with low coercivity material for MFM on soft magnetic samples.
f = 75 kHz | k = 2.8 N/m | tip coating: soft magneticStarting at: $691.00
CDT-FMR
Silicon probe with conductive diamond coating for force modulation mode.
f = 105 kHz | k = 6.2 N/m | tip coating: conductive diamondStarting at: $1,481.00
PPP-FMAu
Conductive silicon probe with Au coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: AuStarting at: $384.00
PtSi-NCH
Sharp conductive probe with PtSi coating for electrical measurements.
f = 330 kHz | k = 42 N/m | tip coating: PtSiStarting at: $1,481.00
CDT-CONTR
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 20 kHz | k = 0.5 N/m | tip coating: conductive diamondStarting at: $1,481.00
PPP-NCSTAu
Conductive probe with Au coating for soft tapping mode electrical measurements.
f = 160 kHz | k = 7.4 N/m | tip coating: AuStarting at: $384.00
PPP-NCLAu
Conductive silicon probe with long cantilever for conductive measurements.
f = 190 kHz | k = 48 N/m | tip coating: AuStarting at: $384.00
ATEC-CONTAu
Conductive silicon probe with visible tip apex for contact mode electrical measurements.
f = 15 kHz | k = 0.2 N/m | tip coating: AuStarting at: $890.00
PPP-CONTSCPt
Conductive probe with short cantilever for electrical measurements in contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: Pt/IrStarting at: $449.00
DT-CONTR
Silicon probe with Al reflex coating and diamond coated tip for contact mode on tip degrading samples.
f = 20 kHz | k = 0.5 N/m | tip coating: diamondStarting at: $1,185.00
PPP-CONTSCAu
Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
f = 23 kHz | k = 0.2 N/m | tip coating: AuStarting at: $384.00
PPP-NCLPt
Conductive probe with long cantilever for electrical measurements.
f = 190 kHz | k = 48 N/m | tip coating: Pt/IrStarting at: $449.00
DT-NCLR
Silicon probe with diamond coated tip and long cantilever for tip degrading samples.
f = 210 kHz | k = 72 N/m | tip coating: diamondStarting at: $1,185.00
PL2-CONT
Silicon probe with plateau tip for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: noneStarting at: $889.00
DT-FMR
Silicon probe with Al reflex coating and diamond coated tip for force modulation mode on tip degrading samples.
f = 105 kHz | k = 6.2 N/m | tip coating: diamondStarting at: $1,119.00
PPP-NCSTPt
Conductive probe for electrical measurements in soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: Pt/IrStarting at: $449.00
PPP-CONTPt
Conductive probe for electrical measurements in contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: Pt/IrStarting at: $449.00
PtSi-CONT
Silicon probe with PtSi coating for contact mode
f = 13 kHz | k = 0.2 N/m | tip coating: PtSiStarting at: $1,481.00
CDT-NCLR
Silicon probe with conductive diamond coated tip and long cantilever for electrical measurements.
f = 210 kHz | k = 72 N/m | tip coating: conductive diamondStarting at: $1,481.00
PL2-CONTR
Silicon probe with Al reflective coating and plateau tip for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: noneStarting at: $889.00
PPP-NCHPt
Conductive probe for electrical measurements.
f = 330 kHz | k = 42 N/m | tip coating: Pt/IrStarting at: $449.00
DT-NCHR
Silicon probe with diamond coated tip for tapping/non-contact mode on tip degrading samples.
f = 400 kHz | k = 80 N/m | tip coating: diamondStarting at: $1,185.00
ATEC-FMAu
Conductive probe with tip visible at end of lever.
f = 85 kHz | k = 2.8 N/m | tip coating: AuStarting at: $890.00
PL2-NCL
Silicon probe with plateau tip.
f = 190 kHz | k = 48 N/m | tip coating: noneStarting at: $889.00
ATEC-NCAu
Conductive silicon probe with Au tip coating and visible tip apex.
f = 335 kHz | k = 45 N/m | tip coating: AuStarting at: $890.00
PL2-NCH
Silicon probe with plateau tip for non-contact/tapping mode.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $889.00
PL2-NCHR
Silicon probe with plateau tip with Al reflex coating.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $889.00
PL2-FM
Silicon probe with plateau tip for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: noneStarting at: $889.00
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PL2-FMR
Silicon probe with plateau tip and Al reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: noneStarting at: $889.00
PPP-QLC-MFMR
Silicon probe coated with low coercivity material for MFM in vacuum.
f = 75 kHz | k = 2.8 N/m | tip coating: soft magneticStarting at: $1,185.00
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