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Probes
BioLever fast (also known as BL-AC10DS); ultra small cantilever for tapping mode in liquid.
Only on AFMs with
small laser spot such as Cypher.
f = 1500 kHz | k = 0.1 N/m | tip coating: none
BioLever Mini; small nitride cantilever with silicon tip for tapping mode in liquid.
f = 110 kHz | k = 0.09 N/m | tip coating: none
BioLever fast with CNF tips (also known as BL-AC10FS); Carbon Nano Fiber probe for high resolution imaging.
Only on AFMs with
small laser spot such as Cypher.
f = 1500 kHz | k = 0.1 N/m | tip coating: none
Supersharp EBID carbon AFM probe with 2 nm tip radius on soft 0.4 N/m cantilever.
f = 60 kHz | k = 0.4 N/m | tip coating: none
Quartz like probe with more stability for contact mode.
f = 30 kHz | k = 0.1 N/m | tip coating: none
Silicon probe with short cantilever and Al reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
High performance EBID carbon AFM probe with guaranteed tip radius of 6-7 nm on soft 0.4 N/m cantilever.
f = 60 kHz | k = 0.4 N/m | tip coating: none
Silicon probe without reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Al reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with short cantilever and Au reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with visible tip apex for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Au reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with rotated tip and Al reflective coating for contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with short cantilever without reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Conductive silicon probe with visible tip apex for contact mode electrical measurements.
f = 15 kHz | k = 0.2 N/m | tip coating: Au
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 20 kHz | k = 0.5 N/m | tip coating: conductive diamond
Silicon probe with plateau tip for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Al reflex coating and diamond coated tip for contact mode on tip degrading samples.
f = 20 kHz | k = 0.5 N/m | tip coating: diamond
Conductive silicon probe with Au tip coating for contact mode electrical measurements.
f = 15 kHz | k = 0.2 N/m | tip coating: Au
Conductive probe with short cantilever for electrical measurements in contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: Pt/Ir
Silicon probe with Al reflective coating and plateau tip for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Conductive probe with visible tip apex for electrical measurements in contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: Pt/Ir
Silicon probe for lateral force microscopy.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
f = 23 kHz | k = 0.2 N/m | tip coating: Au
Silicon probe with PtSi coating for contact mode
f = 13 kHz | k = 0.2 N/m | tip coating: PtSi
Conductive probe for electrical measurements in contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: Pt/Ir
Tipless soft cantilever.
f = 13 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with XY auto-alignment and Al reflective coating for contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: none
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