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Probes
EFM
Silicon probe with PtIr coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $419.00
NCHPt
Silicon probe with PtIr coating for tapping/non-contact mode.
f = 320 kHz | k = 42 N/m | tip coating: Pt/IrStarting at: $419.00
NCLPt
Silicon probe with long cantilever and PtIr coating for tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: PtIrStarting at: $419.00
Arrow NCPt
Silicon probe with PtIr coating for contact mode.
f = 285 kHz | k = 42 N/m | tip coating: Pt/IrStarting at: $407.00
CONTPt
Test Conductive probe with visible tip apex for electrical measurements in contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: Pt/Ir
Arrow EFM
Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $407.00
Arrow CONTPt
Silicon probe with tip at the end of cantilever and PtIr coating for contact mode.
f = 14 kHz | k =0.2 N/m | tip coating: PtIrStarting at: $407.00
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