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Probes

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30 Item(s)

  1. Arrow UHFAuD

    Silicon probe with visible tip apex and Au reflex coating for high speed imaging.
    f = 2000 kHz   |   tip coating: none

    Starting at: $600.00

  2. Arrow UHF

    Silicon probe with visible tip apex and Al reflex coating for high speed imaging.
    f = 2000 kHz   |   tip coating: none

    Starting at: $600.00

  3. NCST

    Silicon probe with no reflex coating for soft tapping mode.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: none

    Starting at: $279.00

  4. NCHPt

    Silicon probe with PtIr coating for tapping/non-contact mode.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: Pt/Ir

    Starting at: $419.00

  5. NCSTR

    Silicon probe with Al reflex coating for soft tapping mode.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: none

    Starting at: $307.00

  6. USC-F2-k3

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 2000 kHz   |   k = 3 N/m   |   tip coating: none

    Starting at: $980.00

  7. NCHR

    Silicon probe with Al reflex coating for tapping/non-contact mode.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $307.00

  8. NW-CDT-NCHR

    Nanoworld silicon probe with conductive diamond coating for tapping/non-contact mode.
    f = 400 kHz   |   k = 80 N/m   |   tip coating: conductive diamond

    Starting at: $1,399.00

  9. USC-F1.2-k0.15

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 1200 kHz   |   k = 0.15 N/m   |   tip coating: none

    Starting at: $980.00

    Ships in 1-2 Weeks

  10. NW-AR5T-NCHR

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $1,259.00

  11. USC-F0.3-k0.3

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 300 kHz   |   k = 0.3 N/m   |   tip coating: none

    Starting at: $980.00

  12. USC-F1.2-k7.3

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 1200 kHz   |   k = 7.3 N/m   |   tip coating: none

    Starting at: $980.00

  13. NW-CDT-FMR

    Silicon probe with conductive diamond coating for force modulation mode.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: conductive diamond

    Starting at: $1,399.00

  14. NW-SSS-NCH

    Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $699.00

  15. NCH

    Silicon probe with no reflex coating for tapping/non-contact mode.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $279.00

  16. Arrow NC

    Silicon probe with tip at the end of cantilever and no reflex coating for tapping/non-contact mode.
    f = 285 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $245.00

  17. NW-AR10-NCHR

    Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $1,259.00

  18. Arrow NCR

    Silicon probe with tip at the end of cantilever and Al reflex coating for tapping/non-contact mode.
    f = 285 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $270.00

  19. NW-AR5-NCHR

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $839.00

  20. NCLPt

    Silicon probe with long cantilever and PtIr coating for tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: PtIr

    Starting at: $419.00

  21. NW-CDT-NCLR

    Nanoworld silicon probe with long cantilever and conductive diamond coating for tapping/non-contact mode.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: conductive diamond

    Starting at: $1,399.00

  22. Arrow NCPt

    Silicon probe with PtIr coating for contact mode.
    f = 285 kHz   |   k = 42 N/m   |   tip coating: Pt/Ir

    Starting at: $370.00

  23. USC-F1.5-k0.6

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 1500 kHz   |   k = 0.6 N/m   |   tip coating: none

    Starting at: $980.00

  24. NW-AR5-NCLR

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $839.00

  25. NW-DT-FMR

    Silicon probe with Al reflex coating and diamond coated tip for force modulation mode on tip degrading samples.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: diamond

    Starting at: $1,119.00

  26. NW-SSS-NCL

    Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $699.00

  27. NW-DT-NCHR

    Silicon probe with diamond coated tip for tapping/non-contact mode on tip degrading samples.
    f = 400 kHz   |   k = 80 N/m   |   tip coating: diamond

    Starting at: $1,119.00

  28. NCL

    Silicon probe with long cantilever and no reflex coating for tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $279.00

  29. NW-DT-NCLR

    Silicon probe with diamond coated tip and long cantilever for tip degrading samples.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: diamond

    Starting at: $1,119.00

  30. NCLR

    Silicon probe with long cantilever and Al reflex coating for tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $307.00

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30 Item(s)