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Probes
Also known as OLTESPA; medium soft cantilever for topgraphy and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
BioLever Mini; small nitride cantilever with silicon tip for tapping mode in liquid.
f = 110 kHz | k = 0.09 N/m | tip coating: none
Also known as OTESPA; silicon probe with visible apex tip for tapping mode.
f = 300 kHz | k = 26 N/m | tip coating: none
BioLever fast (also known as BL-AC10DS); ultra small cantilever for tapping mode in liquid.
Only on AFMs with
small laser spot such as Cypher.
f = 1500 kHz | k = 0.1 N/m | tip coating: none
Silicon probe with visible apex tip for force modulation or soft tapping on medium to hard samples.
f = 150 kHz | k =9 N/m | tip coating: none
Asylum electrolever with visible tip apex and conductive coating for nano-electrical measurements
f = 75 kHz | k = 2.8 N/m | tip coating: Ti/Ir
OLTESPA with Au reflective coating; medium soft cantilever for topography and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
f = 285 kHz | k = 42 N/m | tip coating: Ti/Ir
BioLever fast with CNF tips (also known as BL-AC10FS); Carbon Nano Fiber probe for high resolution imaging.
Only on AFMs with
small laser spot such as Cypher.
f = 1500 kHz | k = 0.1 N/m | tip coating: none
Silicon probe with visible tip apex and magnetic coating for high coercivity MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoPt/FePt
Silicon probe with visible tip apex and magnetic coating for high moment MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoCr
Also known as OSCM; conductive probe with visible apex tip for electrical measurement.
f = 70 kHz | k = 2 N/m | tip coating: Ti/Pt
Fast silicon probe with visible apex tip for fast imaging.
Only on AFMs with
small laser spot such as Cypher.
f = 1600 kHz | k = 85 N/m | tip coating: none
Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
f = 300 kHz | k = 42 N/m | tip coating: Ti/Ir
Silicon probe with visible tip apex and Al reflex coating for high speed imaging.
f = 1500 kHz | tip coating: none
Silicon probe with visible tip apex and magnetic coating for low coercivity MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: permalloy
Silicon probe with visible tip apex and Au reflex coating for high speed imaging.
f = 1500 kHz | tip coating: none
Silicon probe with visible tip apex and magnetic coating for standard MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoCr
OTESPA with Au reflective coating; silicon probe with visible apex tip for tapping mode.
f = 300 kHz | k = 26 N/m | tip coating: none
Silicon probe with visible tip apex and magnetic coating for low moment MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoCr
Spherical EBID carbon AFM tips with various different radii for precise nanoindentation measurements and advanced data modelling.
tip radius = 20 - 2000 nm | k = 0.2 - 2000 N/m | tip coating: none
High performance EBID carbon AFM probe with guaranteed tip radius of 6-7 nm on soft 0.4 N/m cantilever.
f = 60 kHz | k = 0.4 N/m | tip coating: none
Five each of Asylum MFM levers (ASYMFM; ASYMFMHC-R2; ASYMFMHM; ASYMFMLC; ASYMFMLM); Veeco equiv - MESPSP
Nitride probe with shielded co-axial sensor specialized for sMIM applications.
f = 19 kHz | k = 1 N/m | tip coating: TiW/Au
EBD-FESPA: Diamond-like carbon probe with unrivaled lifetime. For uninterrupted AFM imaging in gentle tapping and non-contact mode in air.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Carbon tip with 25 nm radius on soft qp-BioAC quartz probe; For gentle imaging of force-sensitive samples.
f = 50 kHz | k = 0.1 N/m | tip coating: none
200 nm long carbon tip with 2 nm radius on soft qp-BioAC probe; Designed for gentle, high resolution bioimaging.
f = 50 kHz | k = 0.1 N/m | tip coating: none
EBD-TESPA: Diamond-like carbon probe with unrivaled lifetime. For uninterrupted AFM operation in tapping and non-contact mode in air.
f = 320 kHz | k = 40 N/m | tip coating: none
Supersharp EBID carbon AFM probe with 2 nm tip radius on soft 0.4 N/m cantilever.
f = 60 kHz | k = 0.4 N/m | tip coating: none
Nitride probe with shielded co-axial sensor specialized for sMIM applications.
f = 75 kHz | k = 8 N/m | tip coating: TiW/Au
15 um long carbon tip with 25 nm radius on soft qp-BioAC cantilever; For enhanced accessibility to subjacent regions of tall biosamples.
f = 50 kHz | k = 0.1 N/m | tip coating: none
Fast scanning probe with full carbon tip; for ultrafast high resolution bioimaging.
f = 1200 kHz | k = 18 N/m | tip coating: none
Solid platinum probe for electrical measurements.
f = 100 kHz | k = 250 N/m | tip material: Pt
Solid platinum probe for electrical measurements.
f = 10 kHz | k = 8 N/m | tip material: Pt
Nitride probe with two triangular cantilevers for iDrive mode.
f = 10 & 32 kHz | k =0.02 & 0.09 N/m | tip coating: Cr/Au
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: Pt
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: Pt
Solid platinum probe for electrical measurements.
f = 9 kHz | k = 0.8 N/m | tip material: Pt
Solid platinum probe for electrical measurements.
f = 4.5 kHz | k = 0.3 N/m | tip material: Pt
Nitride probe with two triangular cantilevers for iDrive imaging.
f = 22 & 68 kHz | k =0.16 & 0.61 N/m | tip coating: Cr/Au
Platinum/Iridium (80/20) mechanically formed tip for STM application.
Dia = 0.01" | lngth = 0.28" | tip material: Pt
silicon nitride sharpened wedge tip for tapping mode in liquid.
f = 160 kHz | k = 15 N/m | tip coating: none
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