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Probes
Asylum electrolever with visible tip apex and conductive coating for nano-electrical measurements
f = 75 kHz | k = 2.8 N/m | tip coating: Ti/Ir
Also known as OLTESPA; medium soft cantilever for topgraphy and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
OLTESPA with Au reflective coating; medium soft cantilever for topography and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
Sharp conductive probe with PtSi coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: PtSi
Silicon probe with visible tip apex and magnetic coating for low coercivity MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: permalloy
Silicon probe with visible tip apex and magnetic coating for high coercivity MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoPt/FePt
Silicon probe with sharp tip for high resolution imaging in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with visible tip apex and magnetic coating for standard MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoCr
Silicon probe with visible tip apex and magnetic coating for low moment MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoCr
Silicon probe with visible tip apex and magnetic coating for high moment MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoCr
Also known as OSCM; conductive probe with visible apex tip for electrical measurement.
f = 70 kHz | k = 2 N/m | tip coating: Ti/Pt
Nitride probe with shielded co-axial sensor specialized for sMIM applications.
f = 75 kHz | k = 8 N/m | tip coating: TiW/Au
Silicon probe with Al reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Quartz like probe with more stability for soft contact mode.
f = 11 kHz | k = 0.01 N/m | tip coating: none
Five each of Asylum MFM levers (ASYMFM; ASYMFMHC-R2; ASYMFMHM; ASYMFMLC; ASYMFMLM); Veeco equiv - MESPSP
Silicon probe with short cantilever and Al reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe without reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Nitride probe with shielded co-axial sensor specialized for sMIM applications.
f = 19 kHz | k = 1 N/m | tip coating: TiW/Au
Quartz like probe with two triangular cantilevers for contact mode.
f = 20 & 50 kHz | k = 0.08 & 0.3 N/m | tip coating: none
Force modulation with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 65 kHz | k = 2.8 N/m | tip coating: diamond tip
Silicon probe with sharp tip for high resolution imaging in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe coated with high moment material for MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magnetic
Conductive probe for electrical measurements in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/Ir
Quartz like probe with more stability for contact mode.
f = 30 kHz | k = 0.1 N/m | tip coating: none
Silicon probe with no reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Quartz like probe with three cantilevers for contact mode.
f = 30 & 50 & 90 kHz | k = 0.06 & 0.1 & 0.3 N/m | tip coating: none
Force modulation probe with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 65 kHz | k = 2.8 N/m | tip coating: diamond tip
Silicon probe with Au reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe coated with low moment material for MFM on magnetic samples.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magnetic
Solid platinum probe for electrical measurements.
f = 10 kHz | k = 8 N/m | tip material: Pt
Silicon probe with tip visible at end of lever for force modulation.
f = 85 kHz | k = 2.8 N/m | tip coating: none
Solid platinum probe for electrical measurements.
f = 100 kHz | k = 250 N/m | tip material: Pt
Silicon probe coated with thin magnetic material for high resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magnetic
Conductive probe with visible tip apex for electrical measurements in modulation mode.
f = 85 kHz | k = 2.8 N/m | tip coating: Pt/Ir
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: Pt
Silicon probe with rotated tip and Al reflective coating for contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with rotated tip for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with Al reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Solid platinum probe for electrical measurements.
f = 9 kHz | k = 0.8 N/m | tip material: Pt
Silicon probe with Au reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with short cantilever and Au reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Nitride probe with two triangular cantilevers for iDrive mode.
f = 10 & 32 kHz | k =0.02 & 0.09 N/m | tip coating: Cr/Au
Silicon probe coated with low coercivity material for MFM on soft magnetic samples.
f = 75 kHz | k = 2.8 N/m | tip coating: soft magnetic
Silicon probe with visible tip apex for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: Pt
Silicon probe with short cantilever without reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Nitride probe with two triangular cantilevers for iDrive imaging.
f = 22 & 68 kHz | k =0.16 & 0.61 N/m | tip coating: Cr/Au
Conductive silicon probe with visible tip apex for contact mode electrical measurements.
f = 15 kHz | k = 0.2 N/m | tip coating: Au
Conductive silicon probe with Au coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: Au
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 20 kHz | k = 0.5 N/m | tip coating: conductive diamond
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