Americas
North America
South America
Canada
Australia
The Asylum Research Store and Support will be closed for the holidays 12/20/2019 - 1/2/2020
Probes
ASYELEC.01-R2
Asylum electrolever with visible tip apex and conductive coating for nano-electrical measurements
f = 75 kHz | k = 2.8 N/m | tip coating: Ti/IrStarting at: $350.00
AC240TS-R3
Also known as OLTESPA; medium soft cantilever for topgraphy and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: noneStarting at: $360.00
AC240TSA-R3
OLTESPA with Au reflective coating; medium soft cantilever for topography and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
PtSi-FM
Sharp conductive probe with PtSi coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: PtSiStarting at: $1,481.00
ASYMFMLC-R2
Silicon probe with visible tip apex and magnetic coating for low coercivity MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: permalloyStarting at: $375.00
ASYMFMHC-R2
Silicon probe with visible tip apex and magnetic coating for high coercivity MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoPt/FePtStarting at: $450.00
SSS-FM
Silicon probe with sharp tip for high resolution imaging in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: noneStarting at: $757.00
ASYMFM-R2
Silicon probe with visible tip apex and magnetic coating for standard MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoCrStarting at: $325.00
ASYMFMLM-R2
Silicon probe with visible tip apex and magnetic coating for low moment MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoCrStarting at: $375.00
ASYMFMHM-R2
Silicon probe with visible tip apex and magnetic coating for high moment MFM applications.
f = 75 kHz | k = 2.8 N/m | tip coating: CoCrStarting at: $375.00
AC240TM-R3
Also known as OSCM; conductive probe with visible apex tip for electrical measurement.
f = 70 kHz | k = 2 N/m | tip coating: Ti/PtStarting at: $400.00
SMIM150-G5
Nitride probe with shielded co-axial sensor specialized for sMIM applications.
f = 75 kHz | k = 8 N/m | tip coating: TiW/AuStarting at: $750.00
PPP-FMR
Silicon probe with Al reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: noneStarting at: $320.00
qp-SCONT
Quartz like probe with more stability for soft contact mode.
f = 11 kHz | k = 0.01 N/m | tip coating: noneStarting at: $395.00
ASYMFMSMPL
Five each of Asylum MFM levers (ASYMFM; ASYMFMHC-R2; ASYMFMHM; ASYMFMLC; ASYMFMLM); Veeco equiv - MESPSPStarting at: $1,700.00
PPP-CONTSCR
Silicon probe with short cantilever and Al reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: noneStarting at: $320.00
PPP-CONT
Silicon probe without reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: noneStarting at: $320.00
SMIM300-G5
Nitride probe with shielded co-axial sensor specialized for sMIM applications.
f = 19 kHz | k = 1 N/m | tip coating: TiW/AuStarting at: $750.00
qp-BioT
Quartz like probe with two triangular cantilevers for contact mode.
f = 20 & 50 kHz | k = 0.08 & 0.3 N/m | tip coating: noneStarting at: $395.00
AD-2.8-SS
Force modulation with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 65 kHz | k = 2.8 N/m | tip coating: diamond tip
SSS-FMR
Silicon probe with sharp tip for high resolution imaging in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: noneStarting at: $757.00
PPP-MFMR
Silicon probe coated with high moment material for MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magneticStarting at: $691.00
PPP-EFM
Conductive probe for electrical measurements in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $449.00
qp-CONT
Quartz like probe with more stability for contact mode.
f = 30 kHz | k = 0.1 N/m | tip coating: noneStarting at: $395.00
PPP-FM
Silicon probe with no reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: noneStarting at: $320.00
qp-BioAC
Quartz like probe with three cantilevers for contact mode.
f = 30 & 50 & 90 kHz | k = 0.06 & 0.1 & 0.3 N/m | tip coating: noneStarting at: $395.00
AD-2.8-AS
Force modulation probe with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 65 kHz | k = 2.8 N/m | tip coating: diamond tip
PPP-CONTAuD
Silicon probe with Au reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: noneStarting at: $320.00
PPP-LM-MFMR
Silicon probe coated with low moment material for MFM on magnetic samples.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magneticStarting at: $691.00
25PT400B
Solid platinum probe for electrical measurements.
f = 10 kHz | k = 8 N/m | tip material: PtStarting at: $800.00
ATEC-FM
Silicon probe with tip visible at end of lever for force modulation.
f = 85 kHz | k = 2.8 N/m | tip coating: noneStarting at: $445.00
25Pt200B-H
Solid platinum probe for electrical measurements.
f = 100 kHz | k = 250 N/m | tip material: Pt
SSS-MFMR
Silicon probe coated with thin magnetic material for high resolution MFM.
f = 75 kHz | k = 2.8 N/m | tip coating: hard magneticStarting at: $1,185.00
ATEC-EFM
Conductive probe with visible tip apex for electrical measurements in modulation mode.
f = 85 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $890.00
25PT300B-10
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: PtStarting at: $500.00
PPP-RT-CONTR
Silicon probe with rotated tip and Al reflective coating for contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: noneStarting at: $320.00
PPP-RT-FMR
Silicon probe with rotated tip for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: noneStarting at: $320.00
PPP-CONTR
Silicon probe with Al reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: noneStarting at: $320.00
12PT300B
Solid platinum probe for electrical measurements.
f = 9 kHz | k = 0.8 N/m | tip material: PtStarting at: $400.00
PPP-FMAuD
Silicon probe with Au reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: noneStarting at: $320.00
PPP-CONTSCAuD
Silicon probe with short cantilever and Au reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: noneStarting at: $320.00
BL-TR400PB
Nitride probe with two triangular cantilevers for iDrive mode.
f = 10 & 32 kHz | k =0.02 & 0.09 N/m | tip coating: Cr/AuStarting at: $450.00
PPP-LC-MFMR
Silicon probe coated with low coercivity material for MFM on soft magnetic samples.
f = 75 kHz | k = 2.8 N/m | tip coating: soft magneticStarting at: $691.00
ATEC-CONT
Silicon probe with visible tip apex for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: noneStarting at: $445.00
25PT300B
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: PtStarting at: $400.00
PPP-CONTSC
Silicon probe with short cantilever without reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: noneStarting at: $320.00
BL-TR800PB
Nitride probe with two triangular cantilevers for iDrive imaging.
f = 22 & 68 kHz | k =0.16 & 0.61 N/m | tip coating: Cr/Au
ATEC-CONTAu
Conductive silicon probe with visible tip apex for contact mode electrical measurements.
f = 15 kHz | k = 0.2 N/m | tip coating: AuStarting at: $890.00
PPP-FMAu
Conductive silicon probe with Au coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: AuStarting at: $384.00
CDT-CONTR
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 20 kHz | k = 0.5 N/m | tip coating: conductive diamondStarting at: $1,481.00
© 2016 Oxford Instruments Asylum Research, Inc. All Rights Reserved.
