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Probes
AC10DS
BioLever fast (also known as BL-AC10DS); ultra small cantilever for tapping mode in liquid.
Only on AFMs with small laser spot such as Cypher.
f = 1500 kHz | k = 0.1 N/m | tip coating: noneStarting at: $600.00
BL-AC40TS
BioLever Mini; small nitride cantilever with silicon tip for tapping mode in liquid.
f = 110 kHz | k = 0.09 N/m | tip coating: noneStarting at: $500.00
PtSi-FM
Sharp conductive probe with PtSi coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: PtSiStarting at: $1,481.00
AC240TSA-R3
OLTESPA with Au reflective coating; medium soft cantilever for topography and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
AC160TSA-R3
OTESPA with Au reflective coating; silicon probe with visible apex tip for tapping mode.
f = 300 kHz | k = 26 N/m | tip coating: noneStarting at: $410.00
AC10FS
BioLever fast with CNF tips (also known as BL-AC10FS); Carbon Nano Fiber probe for high resolution imaging.
Only on AFMs with small laser spot such as Cypher.
f = 1500 kHz | k = 0.1 N/m | tip coating: noneStarting at: $2,800.00
AC55TS
Fast silicon probe with visible apex tip for fast imaging.
Only on AFMs with small laser spot such as Cypher.
f = 1600 kHz | k = 85 N/m | tip coating: noneStarting at: $325.00
AD-40-SS
Tapping mode probe with a super sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 180 kHz | k = 40 N/m | tip coating: diamond tip
AD-2.8-SS
Force modulation with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 65 kHz | k = 2.8 N/m | tip coating: diamond tip
AD-40-AS
with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 180 kHz | k = 40 N/m | tip coating: diamond tip
PPP-NCHAuD
Silicon probe with Au reflex coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: noneStarting at: $320.00
AD-2.8-AS
Force modulation probe with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 65 kHz | k = 2.8 N/m | tip coating: diamond tip
BL-TR400PB
Nitride probe with two triangular cantilevers for iDrive mode.
f = 10 & 32 kHz | k =0.02 & 0.09 N/m | tip coating: Cr/AuStarting at: $450.00
PPP-NCHAu
Conductive silicon probe with Au tip coating for electrical measurements in non-contact/tapping mode.
f = 330 kHz | k = 42 N/m | tip coating: AuStarting at: $384.00
PPP-CONTSCAuD
Silicon probe with short cantilever and Au reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: noneStarting at: $320.00
PPP-NCSTAuD
Silicon probe with Au reflective coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: noneStarting at: $320.00
PPP-NCLAuD
Silicon probe with long cantilevr and Au reflective coating for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: noneStarting at: $320.00
PPP-CONTAuD
Silicon probe with Au reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: noneStarting at: $320.00
PPP-FMAuD
Silicon probe with Au reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: noneStarting at: $320.00
ATEC-CONTAu
Conductive silicon probe with visible tip apex for contact mode electrical measurements.
f = 15 kHz | k = 0.2 N/m | tip coating: AuStarting at: $890.00
PPP-NCSTAu
Conductive probe with Au coating for soft tapping mode electrical measurements.
f = 160 kHz | k = 7.4 N/m | tip coating: AuStarting at: $384.00
PPP-NCLAu
Conductive silicon probe with long cantilever for conductive measurements.
f = 190 kHz | k = 48 N/m | tip coating: AuStarting at: $384.00
BL-TR800PB
Nitride probe with two triangular cantilevers for iDrive imaging.
f = 22 & 68 kHz | k =0.16 & 0.61 N/m | tip coating: Cr/Au
PPP-FMAu
Conductive silicon probe with Au coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: AuStarting at: $384.00
PtSi-NCH
Sharp conductive probe with PtSi coating for electrical measurements.
f = 330 kHz | k = 42 N/m | tip coating: PtSiStarting at: $1,481.00
ATEC-FMAu
Conductive probe with tip visible at end of lever.
f = 85 kHz | k = 2.8 N/m | tip coating: AuStarting at: $890.00
PPP-CONTSCAu
Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
f = 23 kHz | k = 0.2 N/m | tip coating: AuStarting at: $384.00
PPP-CONTAu
Conductive silicon probe with Au tip coating for contact mode electrical measurements.
f = 15 kHz | k = 0.2 N/m | tip coating: AuStarting at: $384.00
PtSi-CONT
Silicon probe with PtSi coating for contact mode
f = 13 kHz | k = 0.2 N/m | tip coating: PtSiStarting at: $1,481.00
ATEC-NCAu
Conductive silicon probe with Au tip coating and visible tip apex.
f = 335 kHz | k = 45 N/m | tip coating: AuStarting at: $890.00
HA100WS
silicon nitride sharpened wedge tip for tapping mode in liquid.
f = 160 kHz | k = 15 N/m | tip coating: none
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