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Probes

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Items 101 to 150 of 182 total

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  1. Arrow NCR

    Silicon probe with tip at the end of cantilever and Al reflex coating for tapping/non-contact mode.
    f = 285 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $297.00

  2. PNP-TRS

    Pyrex probe with single nitride cantilever and tip for bio applications
    f = 67 kHz   |   k =0.32 N/m   |   tip coating: none

    Starting at: $440.00

    Ships in 1-2 Weeks

  3. PPP-NCSTAu

    Conductive probe with Au coating for soft tapping mode electrical measurements.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: Au

    Starting at: $384.00

  4. PtSi-NCH

    Sharp conductive probe with PtSi coating for electrical measurements.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: PtSi

    Starting at: $1,481.00

  5. PNP-TR

    Pyrex probe with two triangular nitride cantilevers and tip for life science applications.
    f = 17 & 67 kHz   |   k = 0.08 & 0.32 N/m   |   tip coating: none

    Starting at: $440.00

  6. PPP-CONTSC

    Silicon probe with short cantilever without reflective coating for contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  7. PPP-NCLAu

    Conductive silicon probe with long cantilever for conductive measurements.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: Au

    Starting at: $384.00

  8. Arrow CONT

    Silicon probe with tip at the end of cantilever and no reflex coating for contact mode.
    f = 14 kHz   |   k =0.2 N/m   |   tip coating: none

    Starting at: $270.00

  9. AR5-NCLR

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $889.00

  10. USC-F1.5-k0.6

    Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
    To be used only on AFMs with small laser spot
    f = 1500 kHz   |   k = 0.6 N/m   |   tip coating: none

    Starting at: $980.00

  11. Arrow NCPt

    Silicon probe with PtIr coating for contact mode.
    f = 285 kHz   |   k = 42 N/m   |   tip coating: Pt/Ir

    Starting at: $407.00

  12. NW-AR10-NCHR

    Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $1,259.00

  13. NW-CDT-NCLR

    Nanoworld silicon probe with long cantilever and conductive diamond coating for tapping/non-contact mode.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: conductive diamond

    Starting at: $1,399.00

  14. ATEC-CONTAu

    Conductive silicon probe with visible tip apex for contact mode electrical measurements.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: $890.00

  15. CDT-CONTR

    Silicon probe with conductive diamond coated tip for electrical measurements.
    f = 20 kHz   |   k = 0.5 N/m   |   tip coating: conductive diamond

    Starting at: $1,481.00

  16. PPP-FMAu

    Conductive silicon probe with Au coating for electrical measurements.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Au

    Starting at: $384.00

  17. PNP-TR-Au

    Pyrex probe with two triangular gold coated nitride cantilevers and tip for life science applications.
    f = 17 & 67 kHz   |   k = 0.08 & 0.32 N/m   |   tip coating: AU(35)

    Starting at: $480.00

  18. Arrow CONTR

    Silicon probe with tip at the end of cantilever and AL reflex coating for contact mode.
    f = 14 kHz   |   k =0.2 N/m   |   tip coating: none

    Starting at: $297.00

  19. Arrow NC

    Silicon probe with tip at the end of cantilever and no reflex coating for tapping/non-contact mode.
    f = 285 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $270.00

  20. PNP-DB

    Pyrex probe with two diving board nitride cantilevers and tip for life science applications.
    f = 17 & 67 kHz   |   k = 0.06 & 0.48 N/m   |   tip coating: none

    Starting at: $440.00

  21. NW-AR5-NCHR

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 320 kHz   |   k = 42 N/m   |   tip coating: none

    Starting at: $839.00

  22. AR5-NCL

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $889.00

  23. ATEC-FMAu

    Conductive probe with tip visible at end of lever.
    f = 85 kHz   |   k = 2.8 N/m   |   tip coating: Au

    Starting at: $890.00

  24. PPP-NCLPt

    Conductive probe with long cantilever for electrical measurements.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

  25. Arrow EFM

    Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir

    Starting at: $407.00

  26. PPP-CONTAu

    Conductive silicon probe with Au tip coating for contact mode electrical measurements.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: $384.00

  27. NW-DT-NCLR

    Silicon probe with diamond coated tip and long cantilever for tip degrading samples.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: diamond

    Starting at: $1,119.00

  28. DT-CONTR

    Silicon probe with Al reflex coating and diamond coated tip for contact mode on tip degrading samples.
    f = 20 kHz   |   k = 0.5 N/m   |   tip coating: diamond

    Starting at: $1,185.00

  29. SSS-NCLR

    Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $757.00

  30. NW-AR5-NCLR

    Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $839.00

  31. NCL

    Silicon probe with long cantilever and no reflex coating for tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $279.00

  32. PL2-CONTR

    Silicon probe with Al reflective coating and plateau tip for contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $889.00

  33. NW-DT-FMR

    Silicon probe with Al reflex coating and diamond coated tip for force modulation mode on tip degrading samples.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: diamond

    Starting at: $1,119.00

  34. ATEC-CONTPt

    Conductive probe with visible tip apex for electrical measurements in contact mode.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: $890.00

  35. NW-SSS-NCL

    Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $699.00

  36. PPP-NCSTPt

    Conductive probe for electrical measurements in soft tapping mode.
    f = 160 kHz   |   k = 7.4 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

  37. PPP-CONTPt

    Conductive probe for electrical measurements in contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

  38. PPP-LFMR

    Silicon probe for lateral force microscopy.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: none

    Starting at: $320.00

  39. DT-FMR

    Silicon probe with Al reflex coating and diamond coated tip for force modulation mode on tip degrading samples.
    f = 105 kHz   |   k = 6.2 N/m   |   tip coating: diamond

    Starting at: $1,119.00

  40. PPP-CONTSCAu

    Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: $384.00

  41. PPP-NCHPt

    Conductive probe for electrical measurements.
    f = 330 kHz   |   k = 42 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

  42. Arrow CONTPt

    Silicon probe with tip at the end of cantilever and PtIr coating for contact mode.
    f = 14 kHz   |   k =0.2 N/m   |   tip coating: PtIr

    Starting at: $407.00

  43. NCLR

    Silicon probe with long cantilever and Al reflex coating for tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $307.00

  44. NW-DT-NCHR

    Silicon probe with diamond coated tip for tapping/non-contact mode on tip degrading samples.
    f = 400 kHz   |   k = 80 N/m   |   tip coating: diamond

    Starting at: $1,119.00

  45. CDT-NCLR

    Silicon probe with conductive diamond coated tip and long cantilever for electrical measurements.
    f = 210 kHz   |   k = 72 N/m   |   tip coating: conductive diamond

    Starting at: $1,481.00

  46. PtSi-CONT

    Silicon probe with PtSi coating for contact mode
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: PtSi

    Starting at: $1,481.00

  47. NW-S-MFMR

    Silicon probe coated with low moment material for MFM.
    f = 75 kHz   |   k = 2.8 N/m   |   tip coating: soft magnetic

    Starting at: $615.00

  48. SSS-NCL

    Silicon probe with sharp tip and long cantilever for high resolution imaging in tapping/non-contact mode.
    f = 190 kHz   |   k = 48 N/m   |   tip coating: none

    Starting at: $757.00

  49. CONTPt

    Test Conductive probe with visible tip apex for electrical measurements in contact mode.
    f = 13 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: $419.00

    Ships in 1-2 Weeks

  50. PPP-CONTSCPt

    Conductive probe with short cantilever for electrical measurements in contact mode.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir

    Starting at: $449.00

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Items 101 to 150 of 182 total

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