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Probes
Fast silicon probe with visible apex tip for fast imaging.
Only on AFMs with
small laser spot such as Cypher.
f = 1600 kHz | k = 85 N/m | tip coating: none
Silicon probe with high aspect ratio (>10) tip for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with high aspect ratio tip (>10) for deep trench imaging.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with high aspect ratio tip (>5) for deep trench imaging.
f = 190 kHz | k = 48 N/m | tip coating: none
silicon nitride sharpened wedge tip for tapping mode in liquid.
f = 160 kHz | k = 15 N/m | tip coating: none
Silicon probe with plateau tip.
f = 190 kHz | k = 48 N/m | tip coating: none
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